2010
DOI: 10.1063/1.3428673
|View full text |Cite
|
Sign up to set email alerts
|

Interference effects in the sum frequency generation spectra of thin organic films. II: Applications to different thin-film systems

Abstract: In this paper, the results of the modeling calculations carried out for predicting the interference effects expected in the sum frequency generation ͑SFG͒ spectra of a specific thin-layer system, described in the accompanying paper, are tested by comparing them with the experimental spectra obtained for a real thin-layer film comprising an organic monolayer/variable thickness dielectric layer/gold substrate. In this system, two contributions to the SFG spectra arise, a resonant contribution from the organic fi… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
7
0

Year Published

2010
2010
2023
2023

Publication Types

Select...
8

Relationship

2
6

Authors

Journals

citations
Cited by 26 publications
(7 citation statements)
references
References 43 publications
0
7
0
Order By: Relevance
“…As we will show in the following, one experimental technique that can overcome these challenges is the laser based technique of The Journal of Chemical Physics ARTICLE scitation.org/journal/jcp phase-sensitive sum frequency generation spectroscopy (PS-SFG). SFG spectroscopy is typically applied to study interfaces; [7][8][9][10][11][12][13][14][15] however, in case that the bulk of a sample lacks centrosymmetry both can be probed, its surface and the bulk. 16,17 Like all second order nonlinear spectroscopic techniques, the generated (SFG) signal carries detailed information on the symmetry of the sample.…”
Section: Introductionmentioning
confidence: 99%
“…As we will show in the following, one experimental technique that can overcome these challenges is the laser based technique of The Journal of Chemical Physics ARTICLE scitation.org/journal/jcp phase-sensitive sum frequency generation spectroscopy (PS-SFG). SFG spectroscopy is typically applied to study interfaces; [7][8][9][10][11][12][13][14][15] however, in case that the bulk of a sample lacks centrosymmetry both can be probed, its surface and the bulk. 16,17 Like all second order nonlinear spectroscopic techniques, the generated (SFG) signal carries detailed information on the symmetry of the sample.…”
Section: Introductionmentioning
confidence: 99%
“…This kind of thin-film model can be experimentally reproduced by using deuterated LB multilayers to verify the validity of the calculations and this will be reported in the following paper. 46 In Secs. III B and III C, we first elucidate the thickness dependence of the L factors for the two interfaces ͑buried and free interfaces, Figs.…”
Section: A Model Descriptionmentioning
confidence: 99%
“…The substantial extension of the present model system to other systems including the influence of different experimental parameters, such as the incident beam geometry ͑copropagating and counterpropagating͒, substrate ͑metal and dielectric materials͒, and thin-film structures, on the SFG spectra are discussed in the following paper. 46 In the present study, the incident laser beam angles for the visible and IR beams are set at 65°and 50°, respectively. Changing these angles will affect the L factors and consequently affect the simulated spectral features at different film thicknesses.…”
Section: E Extension To Other Model Systemsmentioning
confidence: 99%
See 1 more Smart Citation
“…The normalized interferogram, J (t IR ), contains the desired spectroscopic information. Equation10 shows that there are three contributions to the measured intensity: the LO intensity, which is independent of t IR and is the first term, the signal from the sample, which slowly varies with t IR and the third term that describes the interference. Theamplitude of the interference signal scales with the square root of the LO intensity and can consequently be increased by raising I LO .…”
mentioning
confidence: 99%