Interference Effects in the Electron Microscopy of Thin Crystal Foils

Bollmann, W.

doi:10.1103/physrev.103.1588

Cited by 235 publications

(44 citation statements)

References 2 publications

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“…[4][5][6] The n-value is controlled by grain size 7) or chemical composition. 8) Therefore, microstructure analyses by X-ray diffraction (XRD), [9][10][11] scanning electron microscope (SEM) [12][13][14] and electron backscatter diffraction…”

Section: Introductionmentioning

confidence: 99%

Development of Biaxial Tensile Test System for <i>In-situ</i> Scanning Electron Microscope and Electron Backscatter Diffraction Analysis

et al. 2016

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Section: Introductionmentioning

confidence: 99%

Development of Biaxial Tensile Test System for <i>In-situ</i> Scanning Electron Microscope and Electron Backscatter Diffraction Analysis

et al. 2016

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“…Transmission Electron Microscopy (TEM) and dislocations are linked in this manner ever since the first images of dislocations were recorded in electron microscopes 50 years ago [1][2][3]. The inner material's structure became accessible revealing dislocations that could be studied and very successfully related to materials properties.…”

Section: Introductionmentioning

confidence: 99%

Sub-angstrom imaging of dislocation core structures: how well are experiments comparable with theory?

Kisielowski

Freitag²,

et al. 2006

Philosophical Magazine

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During the past 50 years Transmission Electron Microscopy (TEM) has evolved from an imaging tool to a quantitative method that approaches the ultimate goal of understanding the atomic structure of materials atom by atom in three dimensions both experimentally and theoretically. Today's TEM abilities are tested in the special case of a Ga terminated 30 degree partial dislocation in GaAs:Be where it is shown that a combination of highresolution phase contrast imaging, Scanning TEM, and local Electron Energy Loss Spectroscopy allows for a complete analysis of dislocation cores and associated stacking faults. We find that it is already possible to locate atom column positions with picometer precision in directly interpretable images of the projected crystal structure and that chemically different elements can already be identified together with their local electronic structure. In terms of theory, the experimental results can be quantitatively compared with ab initio electronic structure total energy calculations. By combining elasticity theory methods with atomic theory an equivalent crystal volume can be addressed. Therefore, it is already feasible to merge experiments and theory on a picometer length scale. While current experiments require the utilization of different, specialized instruments it is foreseeable that the rapid improvement of electron optical elements will soon generate a next generation of microscopes with the ability to image and analyze single atoms in one instrument with deep sub Ångstrom spatial resolution and an energy resolution better than 100 meV.

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“…This idea was put forward in the XX-th century, in the 30's, by Taylor [64], Orowan [50] and Polanyi [54] and was confirmed in 1956 by the first direct observations of dislocations, based on electron microscopy, by Hirsch, Horne, Whelan [34] and Bollmann [11]. We find a description of static equilibrium of dislocations in classical Physics books already written in the late 60's (see for instance Cottrell [17], Read [56], Friedel [29], Nabarro [49], and Hirth and Lothe [35] for a recent presentation).…”

Section: Physical Motivationmentioning

confidence: 99%

Dislocation Dynamics: Short-time Existence and Uniqueness of the Solution

Alvarez

Hoch

Bouar

et al. 2006

Arch Rational Mech Anal

117

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We study a mathematical model describing dislocation dynamics in crystals. We consider a single dislocation line moving in its slip plane. The normal velocity is given by the Peach-Koehler force created by the dislocation line itself. The mathematical model is an eikonal equation whose velocity is a non-local quantity depending on the whole shape of the dislocation line. We study the special cases where the dislocation line is assumed to be a graph or a closed loop. In the framework of discontinuous viscosity solutions for HamiltonJacobi equations, we prove the existence and uniqueness of a solution for small time. We also give physical explanations and a formal derivation of the mathematical model. Finally, we present numerical results based on a level-sets formulation of the problem. These results illustrate in particular the fact that there is no general inclusion principle for this model.

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Interference Effects in the Electron Microscopy of Thin Crystal Foils

Cited by 235 publications

References 2 publications

Development of Biaxial Tensile Test System for <i>In-situ</i> Scanning Electron Microscope and Electron Backscatter Diffraction Analysis

Development of Biaxial Tensile Test System for <i>In-situ</i> Scanning Electron Microscope and Electron Backscatter Diffraction Analysis

Sub-angstrom imaging of dislocation core structures: how well are experiments comparable with theory?

Dislocation Dynamics: Short-time Existence and Uniqueness of the Solution

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