2000
DOI: 10.1080/01418610008212143
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Interfacial wetting and percolation threshold in ultrathin Ni/C multilayer films

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Cited by 15 publications
(9 citation statements)
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“…In addition, there is a critical thickness at about 2.0 nm for Ni layer, below which the interface width increases rapidly from about 0.45 nm to 0.81 nm. This critical thickness of Ni layers is consistent with the results reported by Borchers et al 16,. where the reflectivity of Ni/C multilayer dropped rapidly at a periodic thickness of 4.0 nm with d Ni  = 2.0 nm.…”
Section: Resultssupporting
confidence: 93%
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“…In addition, there is a critical thickness at about 2.0 nm for Ni layer, below which the interface width increases rapidly from about 0.45 nm to 0.81 nm. This critical thickness of Ni layers is consistent with the results reported by Borchers et al 16,. where the reflectivity of Ni/C multilayer dropped rapidly at a periodic thickness of 4.0 nm with d Ni  = 2.0 nm.…”
Section: Resultssupporting
confidence: 93%
“…This fact has also been found by Borchers et al . in the magnetron sputtered Ni/C graded multilayers16.…”
Section: Resultsmentioning
confidence: 99%
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“…The nickel carbide could be found at catalytic reactions [4], carbon nanowhiskers and nanotubes [5]. The Ni3C carbide is a metastable compound obtained by different techniques, including nonequilibrium methods, such as carbon ion implantation into Ni [6], diffusion reactions of nickel and amorphous carbon films [7,8], chemical synthesis [9], and plasma deposition [10]. Besides, the Ni1 -xCx blends (x = 0.10-0.90) were first obtained by reaction milling of elemental powders of Ni and carbon black by T. Tanaka et al in [11].…”
Section: Introductionmentioning
confidence: 99%