2006
DOI: 10.1007/s10853-006-0152-2
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Interfacial structure in silicon nitride sintered with lanthanide oxide

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Cited by 23 publications
(17 citation statements)
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“…Our results put our sites 1 and 2 at 4.3±0.1 and 5.7±0.2 Å, respectively. While there is a slight difference, Dwyer et al 23 showed images that indicated that the HAADF‐STEM images obtained from different groups for this same interface are slightly different, as discussed below with reference to Fig. 6.…”
Section: Resultsmentioning
confidence: 95%
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“…Our results put our sites 1 and 2 at 4.3±0.1 and 5.7±0.2 Å, respectively. While there is a slight difference, Dwyer et al 23 showed images that indicated that the HAADF‐STEM images obtained from different groups for this same interface are slightly different, as discussed below with reference to Fig. 6.…”
Section: Resultsmentioning
confidence: 95%
“… HAADF‐STEM images for La ions at the nitride prism interface with the IGF showing slight differences in La locations both at the interface and within the IGF (at arrows) (modified from Dwyer et al 23 ). …”
Section: Resultsmentioning
confidence: 99%
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“…Therefore, the investigation of their structure and properties is led not only by the theoretical interest but primarily by the strong technical impact. However, these glassy layers of the nanometer order are very difficult to be studied experimentally [2][3][4]. Therefore, the structure and properties of such layers are mostly extrapolated from bulk oxynitride glasses [5][6][7]13,14].…”
Section: Introductionmentioning
confidence: 99%