Interfacial spin effects on Hex in metallic polycrystalline exchange biased systems

Abstract

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Role of oxygen impurity in growth and magnetic properties of Ni83Fe17 permalloy thin films

“…Similar trend was also observed for exchange field obtained at 5 K. Observation of weak exchange bias field in our samples was attributed to the natural oxidation of NiFe film, giving rise an antiferromagnetic (AFM) phase. However, the strength, polarity and the temperature dependence of the exchange bias field in this system depends on the nature of interfacial microstructure as reported by several authors [13][14][15].…”

Effect of Mn Interface Doping in Polycrystalline Exchange Bias Thin Films

“…Firstly the lack of variation in the shapes of the versus curves shows that the addition of Mn at the interface does not affect the AF grain size distribution as seen in Table I. Secondly as does not vary within error the change in is not due to a variation in the bulk properties of the AF layer. This is because the effects of the bulk of the grains are independent of the effects at the interface as shown in our previous work [13].…”

Spontaneous exchange bias formation driven by a structural phase transition in the antiferromagnetic material

“…In fact, it is the exchange interaction between the F and the AF spins at the interface what induces the exchange bias during the setting, and not the external field [Takahashi, 1980]. However, it is well known that the exchange bias field increases considerably upon setting the exchange bias in presence of a high magnetic field, as shown by Fernandez-Outon et al [Fernandez-Outon, 2008]. In most systems,…”

“…In fact, exchange-biased systems are characterized by several other interesting effects and features. Examples of these effects are the reversal asymmetry of the hysteresis loop [Fitzsimmons, 2000], the training effect [Paccard, 1966], the positive exchange bias [Nogués, 2000], the dependence on temperature [Hagedorn, 1967;Schlenker, 1968], time of measurement [Jacobs, 1961], cooling field [Fernandez-Outon, 2008], AF thickness [Xi, 2000], F thickness [Nogués, 1999], crystallinity and texture [Aley, 2008], interface roughness [Pakala, 2000], AF grain size distribution [Vallejo-Fernandez, 2008b] and anisotropy dispersion [McCord, 2003]. The intrinsic complexity of the phenomenon is enhanced by the many different AF/F systems in which exchange bias is detected.…”