2018
DOI: 10.1007/s00339-018-1907-8
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Interfacial reaction and microstructure between the Sn3Ag0.5Cu solder and Cu–Co dual-phase substrate

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Cited by 14 publications
(4 citation statements)
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“…Growth kinetics of IMC layer during the solid-state isothermal ageing can be described according to the empirical power-law relationship as following [ 30 , 31 ]: where Xt is the IMC thickness (m) at ageing time t (s), Xo is the initial thickness of IMC layer after reflow soldering and D is the diffusion coefficient (m 2 /s) and n is the time exponent. The value of time exponent n could be considered as an indicator to dictate the controlling mechanism for the growth of IMC layer.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Growth kinetics of IMC layer during the solid-state isothermal ageing can be described according to the empirical power-law relationship as following [ 30 , 31 ]: where Xt is the IMC thickness (m) at ageing time t (s), Xo is the initial thickness of IMC layer after reflow soldering and D is the diffusion coefficient (m 2 /s) and n is the time exponent. The value of time exponent n could be considered as an indicator to dictate the controlling mechanism for the growth of IMC layer.…”
Section: Resultsmentioning
confidence: 99%
“…Growth kinetics of IMC layer during the solid-state isothermal ageing can be described according to the empirical power-law relationship as following [30,31]:…”
Section: Growth Kinetics Of Imc Layermentioning
confidence: 99%
“…Some studies demonstrated that submicron voids could be formed because of Kirkendall voids within the TLP layers of Cu-Sn [23,33,34], Ni-Sn [35], and Ag-Sn [23] systems. The Kirkendall voids were also observed in joints consisting of Sn-based solders and Cu [15,[36][37][38]. Yu et al reported that the formation of Kirkendall voids as the diffusion rate of Cu atoms is much higher than that of Sn atoms in the Cu 3 Sn layer between the Cu substrate and SAC305 solder [36].…”
Section: Discussionmentioning
confidence: 99%
“…The mechanical properties of the Cu-Sn IMCs indicate higher strengths and creep resistances compared to conventional Sn-based solders [14]. These properties indicate that the Cu-Sn transient liquid-phase sintered (TLPS) joints could be appropriate as a temperature resistant method for power electronics applications; however, Cu-Sn IMCs have been generally used for the purposes of crack formation in conventional soldering because of their quite brittle and stiff properties [15][16][17]. These mechanical properties of the IMCs cause joint fracture during thermal stresses despite the higher melting point of the TLP joints [18][19][20].…”
Section: Introductionmentioning
confidence: 99%