Interfacial Microstructure Evolution for Cu/Cu<sub>3</sub>Sn/Cu Solder Joints during Ultrasonic-Assisted TLP Soldering Process

Han, Xu; Li, Xiaoyan; Yao, Peng; Chen, Dalong

doi:10.1109/eptc47984.2019.9026609

Cited by 2 publications

(1 citation statement)

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“…Recently, TLP has broad application prospects in many fields, and its significant advantages allow it to solve the problem of soldering interconnection [3] . TLP technology enhances the stability and reliability of WBG devices in high-temperature environments by improving their thermal conductivity [4] . In addition, during the TLP bonding process, the Cu porous as the intermediate layer has a significant impact on the solder joints [5] .…”

Section: Introductionmentioning

confidence: 99%

Sn-58Bi/Cu porous joint formation under air condition without pressure

Yu,

Xiong,

et al. 2024

Fourth International Conference on Mechanical Engineering, Intelligent Manufacturing, and Automation Technology (MEMAT 2023)

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Wide bandgap semiconductor (WBG) power electronic devices have broad application prospects in smart energy, but their widespread application still faces challenges. Transient Liquid Phase (TLP) bonding technology can improve the longterm reliability of WBG power electronic devices in high temperature, high pressure, and high-frequency environments. This paper studies the effects of different bonding temperatures and Cu porous thicknesses on the shear strength of welded joints formed by TLP bonding of Sn-58Bi/Cu porous/Sn-58Bi structures under air environments and pressureless conditions. During the bonding process, Cu porous covered with Sn-58Bi solder on the upper and lower sides is used as an intermediate layer to connect the copper plates on both sides. The shear strength of the solder joints gets stronger with temperature in the 150 °C to 250 °C range. When the bonding temperature is 200 °C and the thickness of the Cu porous is 0.3 mm, an excellent metal joint with a shear strength of 68.06 MPa is achieved, which can meet the requirements of power electronic devices.

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Section: Introductionmentioning

confidence: 99%