Abstract:The microstructure and interfaces of SrTiO 3 thin films directly deposited by metalorganic chemical vapor deposition on silicon ͑001͒ substrates were investigated by means of Bragg-diffraction contrast and high-resolution transmission electron microscopy. The observation of the plan-view specimens showed that the SrTiO 3 films are polycrystalline with randomly oriented grains. An amorphous layer was observed at the interfaces between the films and the substrates. The growth kinetics of this amorphous layer was… Show more
“…This saturation behavior, which was also observed in the deposition of HfO 2 with a Hf(NO 3 ) 4 precursor [15] and the deposition of SrTiO 3 on Si(1 0 0) [24], indicates that the interfacial growth is finally controlled by a diffusion-limited mechanism.…”
“…This saturation behavior, which was also observed in the deposition of HfO 2 with a Hf(NO 3 ) 4 precursor [15] and the deposition of SrTiO 3 on Si(1 0 0) [24], indicates that the interfacial growth is finally controlled by a diffusion-limited mechanism.…”
“…For instance, an amorphous layer is often observed between the substrate and the film when PLD is used to deposit metal-oxide on Si. 20,21 It should be noted that the chemical information from different regions (see Fig. 1(b)) has also been mapped by EDS, where the sample was prepared by a focused ion beam technique.…”
“…The change in the oxidation state of Ti ions in SrTiO 3 single crystals by an applied electric field ͑a few tens of kV/cm͒ at elevated temperatures ͑ϳ500°C͒ has been reported by He et al 18 It seems that the excessively high electric field in the thin-film experiments made the oxygen ions move even at room temperature.…”
The resistive switching mechanism of 20-to 57-nm-thick TiO 2 thin films grown by atomic-layer deposition was studied by current-voltage measurements and conductive atomic force microscopy. Electric pulse-induced resistance switching was repetitively ͑Ͼ a few hundred times͒ observed with a resistance ratio ӷ10 2 . Both the low-and high-resistance states showed linear log current versus log voltage graphs with a slope of 1 in the low-voltage region where switching did not occur. The thermal stability of both conduction states was also studied. Atomic force microscopy studies under atmosphere and high-vacuum conditions showed that resistance switching is closely related to the formation and elimination of conducting spots. The conducting spots of the low-resistance state have a few tens times higher conductivity than those of the high-resistance state and their density is also a few tens times higher which results in a ϳ10 3 times larger overall conductivity. An interesting finding was that the area where the conducting spots do not exist shows a few times different resistance between the low-and high-resistance state films. It is believed that this resistance change is due to the difference in point defect density that was generated by the applied bias field. The point defects possibly align to form tiny conducting filaments in the high-resistance state and these tiny conducting filaments gather together to form stronger and more conducting filaments during the transition to the low-resistance state.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.