2014
DOI: 10.1016/j.apsusc.2013.11.128
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Interface state-related linear and nonlinear optical properties of nanocrystalline Si/SiO2 multilayers

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Cited by 18 publications
(9 citation statements)
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“…Photoluminescence at room temperature was observed at 870 nm; the large Stokes shi between the linear absorption edge and emission band implied that the emission might originate from the recombination of photoexcited carriers via interface states with an energy level inside the gap. 56 In Table 2, the nonlinear absorption coefficient and nonlinear refractive index of the sample upon changing the excitation pulse time from ps to fs are shown. When the sample was excited by a picosecond laser, it showed saturation absorption with b ¼ À3.1 Â 10 À6 cm W À1 and n 2 ¼ À1.3 Â 10 À10 cm 2 W À1 .…”
Section: Nonlinear Optical Studies Of Silicon-based Materialsmentioning
confidence: 99%
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“…Photoluminescence at room temperature was observed at 870 nm; the large Stokes shi between the linear absorption edge and emission band implied that the emission might originate from the recombination of photoexcited carriers via interface states with an energy level inside the gap. 56 In Table 2, the nonlinear absorption coefficient and nonlinear refractive index of the sample upon changing the excitation pulse time from ps to fs are shown. When the sample was excited by a picosecond laser, it showed saturation absorption with b ¼ À3.1 Â 10 À6 cm W À1 and n 2 ¼ À1.3 Â 10 À10 cm 2 W À1 .…”
Section: Nonlinear Optical Studies Of Silicon-based Materialsmentioning
confidence: 99%
“…The nonlinear optical response of nc-Si/SiO 2 by changing the excitation pulse duration from ps to fs56 …”
mentioning
confidence: 99%
“…Table 4. Summary data on the forbidden bandwidth and peaks position at different oxidation levels of silicon Bond energy, eV [13] Forbidden bandwidth, eV where ρ-density of the film (g/cm 3 ), x-factor that determines the ratio of silicon and oxygen in the film (relative units).…”
Section: Resultsmentioning
confidence: 99%
“…where Z-atomic number, A-atomic weight (g/mol), ρ-density (g/cm 3 ), E a -average electron energy on the way (keV) and J aaverage ionization potential (keV).…”
Section: Scanning Electron Microscopy With Energy Selection Of Detectmentioning
confidence: 99%
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