1990
DOI: 10.1557/proc-205-325
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Interface Stability During Rapid Directional Solidification

Abstract: At the solidification velocities observed during pulsed laser annealing, the planar interface between solid and liquid is stabilized by capillarity and nonequilibrium effects such as solute trapping. We used Rutherford backscattering and electron microscopy to determine the nonequilibrium partition coefficient and critical concentration for breakdown of the planar interface as a function of interface velocity for Sn-implanted silicon. This allows us to test the applicability of the Mullins- Sekerka stability t… Show more

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Cited by 5 publications
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“…3]. (68)], and with the experimental data obtained for solidification of the Si-Sn alloy [46]. As it is shown in Fig.…”
Section: Discussionmentioning
confidence: 81%
See 4 more Smart Citations
“…3]. (68)], and with the experimental data obtained for solidification of the Si-Sn alloy [46]. As it is shown in Fig.…”
Section: Discussionmentioning
confidence: 81%
“…(**) -Data taken from Ref. [46]. Table 2 Discrepancy between theoretical predictions and experiment for the absolute chemical stability of the planar interface in the Si-0.02(at.fraction)Sn alloy Morphological diagram for solidification of binary systems which is illustrating the microstructural transitions "planar front" → "cellular structure" → "dendrites" → "cellular structure" → "planar front", with the increasing of the solidification velocity, V .…”
Section: Discussionmentioning
confidence: 99%
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