Interface-specific reorientation of embedded tetragonal ZrO2 particles in Ni1−xO polycrystals

Li, Ming-Yen; Shen, Pouyan

doi:10.1016/j.msea.2005.03.087

Cited by 4 publications

(1 citation statement)

References 27 publications

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“…Only interface-specific reorientation of tetragonal ZrO 2 particles embedded in Ni 1Àx O polycrystals, due to the Brownian rotation of the particles until favorable lattice match is reached, had been reported. 23 The experimental evidence showing that the reorientation is induced by the interface is also supported by several theoretical studies. Dickey et al 20 calculated the possible interfaces between Ni and YSZ planes in the near-coincident site lattice (NCSL) framework.…”

Section: Discussionmentioning

confidence: 58%

YSZ‐Induced Crystallographic Reorientation of Ni Particles in Ni–YSZ Cermets

Laguna‐Bercero¹,

Larrea²

2007

Journal of the American Ceramic Society

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Metal–ceramic interfaces in Ni–YSZ (YSZ, yttria‐stabilized zirconia)‐textured porous cermets prepared by reduction of NiO–YSZ directionally solidified eutectics have been studied by transmission electron microscopy and X‐ray pole figure experiments. Before reduction of NiO, the interfacial plane is but after reduction, the Ni phase does not maintain the same crystallographic orientation as the NiO parent phase. Ni undergoes an interface‐induced crystallographic reorientation to form the lower energy (002)Ni∥(002)YSZ interface. This process has been studied as a function of the reduction temperature, and it seems to be more effective at ∼800°C. Metal–ceramic low‐energy interfaces prevent Ni particle coarsening and impart long‐term stability to the cermet.

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Section: Discussionmentioning

confidence: 58%

YSZ‐Induced Crystallographic Reorientation of Ni Particles in Ni–YSZ Cermets

Laguna‐Bercero¹,

Larrea²

2007

Journal of the American Ceramic Society

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The role of metal–ceramic interfaces on the high temperature mechanical response of nanostructured nickel–yttria tetragonal zirconia polycrystals (Ni–YTZP)

et al. 2006

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Interfaces of Mixed Crystallographic Planes of NiO Nanograins

Yeh

Huang

et al. 2010

J. Phys. Chem. C

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A nanofilm method has been developed to study the formation of low-energy interfaces by the rotation of nanograins. Ion-beam sputtering was used to prepare very thin epitaxial NiO nanofilms on the (100), (110), (111), and (112) surfaces of NaCl single crystals. When two different NiO nanofilms were overlapped at different angles and annealed at 300 °C, the nanograins were found to rotate until a stable interface was reached. The stable interfaces were analyzed by transmission electron microscopy. Several previously unreported interfaces were found that belong to the asymmetric [110] tilt boundaries on different low-index planes. The orientation relationships and the structures of the interfaces were analyzed.

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Interface-specific reorientation of embedded tetragonal ZrO2 particles in Ni1−xO polycrystals

Cited by 4 publications

References 27 publications

YSZ‐Induced Crystallographic Reorientation of Ni Particles in Ni–YSZ Cermets

YSZ‐Induced Crystallographic Reorientation of Ni Particles in Ni–YSZ Cermets

The role of metal–ceramic interfaces on the high temperature mechanical response of nanostructured nickel–yttria tetragonal zirconia polycrystals (Ni–YTZP)

Interfaces of Mixed Crystallographic Planes of NiO Nanograins

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