2015
DOI: 10.1016/j.sse.2014.10.009
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Interface pn junction arrays with high yielded grown p-Si microneedles by vapor–liquid–solid method at low temperature

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Cited by 2 publications
(5 citation statements)
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“…01 µm; these penetrations are compatible with microneedle length and substrate thickness (500 ± 50 µm). Compared to the previous work [25], the depletion width in this work is smaller, this is because, the impurity concentration level, in the present work, is higher than the concentration level in the previous work [25]. That is, with the increase of impurity concentration, the depletion width decreases.…”
Section: Resultscontrasting
confidence: 60%
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“…01 µm; these penetrations are compatible with microneedle length and substrate thickness (500 ± 50 µm). Compared to the previous work [25], the depletion width in this work is smaller, this is because, the impurity concentration level, in the present work, is higher than the concentration level in the previous work [25]. That is, with the increase of impurity concentration, the depletion width decreases.…”
Section: Resultscontrasting
confidence: 60%
“…Figure 12 presents the current-voltage behavior of such an interface pn junction formed with n-Si microneedle of 54.8 µm tall and diameter of 3.1 µm. Compared to pn junction with p-Si microneedle [25], the forward current of pn junction with n-Si microneedle is found much larger, this is because, n-Si microneedle is much more conductive than p-Si microneedle. Therefore, pn junction with n-Si microneedle, realized in this work, would be more suitable for sensors and bio applications.…”
Section: Resultsmentioning
confidence: 89%
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