We report on a new approach for measuring the chemical composition of the 20 nanometers at the top or bottom of a polymer film. This approach is based on a variation of the surface enhanced Raman scattering effect with laser illumination through a thin gold layer (∼4 nm). We show that the introduction of the thin gold layer has little or no effect on the morphology of the film that is spin coated on top of it. We demonstrate that this technique has better than 20 nanometer vertical resolution by studying bilayers of polyfluorines with varying thicknesses and by showing the existence of top and bottom wetting layers in a polymer blend of the same polymers. We also show that the top wetting layer is thinner than the bottom one. The difference in thicknesses explains how a solar cell with an electron blocking layer at the cathode works.
■ INTRODUCTIONIn recent years, organic optoelectronic devices based on polymers and small molecules are becoming more and more popular, ranging from organic light emitting diodes (OLED) 1−7 through organic solar cells, 8−11 organic thin film transistors (OTFT) 12,13 and more. The attractive properties of these devices that make them so popular are large versatility of the optoelectronic properties of the materials, ease of manufacturing, excellent mechanical properties and ultrathin thickness. A commonly used architecture in many devices, such as OLED and organic photovoltaic (OPV), is vertical and hence, their functionality is largely determined by the chemical structure and composition in the vertical direction. For the study of the influence of the chemical structure and composition on the optoelectronic properties, characterization techniques with better than 50 nm vertical resolution need to be developed, because the common thicknesses of these devices is around a hundred nanometer Analysis of the vertical structure is usually performed by using either environmental scanning electron microscopy (ESEM) on a cleaved sample 14 or X-ray photoelectron spectroscopy (XPS). 15 The drawbacks of these two techniques are that they are destructive in nature and therefore, cannot be applied in situ to a working device and they both lack spatial resolution in the horizontal direction. A method that has high spatial resolution in all three directions is nanotomography. 16 This technique gives three-dimensional images with high spatial resolution of the topography of the films. However, this technique cannot give an indication on the chemical composition, unless a specific topography feature can be associated with a specific chemical structure. Moreover, because it is based on transmission electron microscope (TEM) it cannot be applied to working devices. A different approach that is short-range and sensitive to the chemical composition is the surface enhanced Raman scattering technique (SERS). The SERS effect 17−23 is a variant of the Raman effect where the Raman cross-section is considerably enhanced in the presence of plasmons in metals. The SERS effect is used to detect low quantities of ma...