2005
DOI: 10.1002/pssc.200562217
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Interface formation of Mg with DiMePTCDI studied by Raman spectroscopy

Abstract: PACS 68.35.Ja, 78.30.Jw Metal/organic interfaces play an important role in the performance of organic based devices. In this work the interface formation between Mg and N,N'-DiMethyl-3,4,9,10-Perylene Tetra Carboxylic DiImide (DiMePTCDI) films grown on sulphur-passivated GaAs (100) substrates is investigated in situ by Raman spectroscopy. The Raman spectra are taken in a backscattering geometry at room temperature under resonance conditions with the 488 nm (2.54 eV) Ar + laser line. They reveal that when Mg is… Show more

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Cited by 3 publications
(7 citation statements)
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“…Moreover, it can be seen that for the F8BT there is an additional peak that appears (∼1520 cm –1 ) when the spectrum is taken on gold. The new peak is an IR mode that becomes active in the presence of the metal. , The second polymer, PFB, has only one peak in this region ∼1603 cm –1 . , …”
Section: Resultsmentioning
confidence: 98%
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“…Moreover, it can be seen that for the F8BT there is an additional peak that appears (∼1520 cm –1 ) when the spectrum is taken on gold. The new peak is an IR mode that becomes active in the presence of the metal. , The second polymer, PFB, has only one peak in this region ∼1603 cm –1 . , …”
Section: Resultsmentioning
confidence: 98%
“…The new peak is an IR mode that becomes active in the presence of the metal. 23, 24 The second polymer, PFB, has only one peak in this region ∼1603 cm −1 . 15,27 After studying the fingerprints of the SERS effect on each polymer we studied two structures that are common for organic photovoltaic devices made from polymers, namely bilayer and blend structure of F8BT and PFB.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
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“…Surfaces and Interfaces of a degraded OLED have been observed by using atomic force microscopy (AFM) and scanning electron microscopy (SEM) [1]. Several major approaches for investigating interfacial properties of OLED include secondary ion mass spectrometry (SIMS) for qualitative and surface analysis [2], X-ray photoelectron spectroscopy (XPS) for chemical and qualitative analysis [2,3], Raman scattering for interface analysis [4,5]. Gap states at organic/electrode interfaces were scrutinized by these microscopic and destructive approaches.…”
Section: Introductionmentioning
confidence: 99%