2016
DOI: 10.1016/j.orgel.2015.12.010
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Interface degradation of perovskite solar cells and its modification using an annealing-free TiO2 NPs layer

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Cited by 100 publications
(71 citation statements)
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“…Sun et al, Sun et al, Sun et al, and Crandall developed a set of physics‐based circuit models for a‐Si, perovskite, CIGS, and CdTe solar cells. These models also contain physical parameters pertaining to degradation pathways unique to these thin‐film technologies, eg, s f and s b in Sun et al can describe the interface degradation in a perovskite solar cell . Hence, these models enable diagnosis of these technology‐specific degradation processes.…”
Section: Discussionmentioning
confidence: 99%
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“…Sun et al, Sun et al, Sun et al, and Crandall developed a set of physics‐based circuit models for a‐Si, perovskite, CIGS, and CdTe solar cells. These models also contain physical parameters pertaining to degradation pathways unique to these thin‐film technologies, eg, s f and s b in Sun et al can describe the interface degradation in a perovskite solar cell . Hence, these models enable diagnosis of these technology‐specific degradation processes.…”
Section: Discussionmentioning
confidence: 99%
“…These models also contain physical parameters pertaining to degradation pathways unique to these thin-film technologies, eg, s f and s b in Sun et al 25 can describe the interface degradation in a perovskite solar cell. 58 Hence, these models enable diagnosis of these technology-specific degradation processes. Second, some thin-film solar modules exhibit efficiency metastability (eg, light soaking 59 ), which needs special treatments in preprocessing the field data.…”
Section: Analyzing Thin-film Modules By the Suns-vmp Methodsmentioning
confidence: 99%
“…Thus the CH3NH3PbI3 thin films on ITO/PEDOT:PSS substrates were prepared and exposed to air for a specified time. The XRD results proved that some degradation happened as the CH3NH3PbI3 thin films exposed to air (RH~45%) for 200 h due to the emergence of the diffraction peak coming from PbI2 crystals [41]. These CH3NH3PbI3 thin films exposed to air for a specified time were used to fabricate PHJ-PSCs with a structure of ITO/PEDOT:PSS/CH3NH3PbI3/PCBM/Al.…”
Section: Planar Heterojunction Pscs With Interface Layer Tio2 Npsmentioning
confidence: 95%
“…The in-situ experiments observed with an optical microscope could follow the degradation process of PHJ-PSCs exposed to air at the initial stage ( Fig. 10 and the video in Ref [41]). The morphology indicated that there were lots of bubbles formed quickly, as indicated by the red arrows, and the bubble size became larger and larger with the exposure time extension.…”
Section: Planar Heterojunction Pscs With Interface Layer Tio2 Npsmentioning
confidence: 96%
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