The synthesis of
large, defect-free two-dimensional materials (2DMs)
such as graphene is a major challenge toward industrial applications.
Chemical vapor deposition (CVD) on liquid metal catalysts (LMCats)
is a recently developed process for the fast synthesis of high-quality
single crystals of 2DMs. However, up to now, the lack of
in
situ
techniques enabling direct feedback on the growth has
limited our understanding of the process dynamics and primarily led
to empirical growth recipes. Thus, an
in situ
multiscale
monitoring of the 2DMs structure, coupled with a real-time control
of the growth parameters, is necessary for efficient synthesis. Here
we report real-time monitoring of graphene growth on liquid copper
(at 1370 K under atmospheric pressure CVD conditions)
via
four complementary
in situ
methods: synchrotron
X-ray diffraction and reflectivity, Raman spectroscopy, and radiation-mode
optical microscopy. This has allowed us to control graphene growth
parameters such as shape, dispersion, and the hexagonal supra-organization
with very high accuracy. Furthermore, the switch from continuous polycrystalline
film to the growth of millimeter-sized defect-free single crystals
could also be accomplished. The presented results have far-reaching
consequences for studying and tailoring 2D material formation processes
on LMCats under CVD growth conditions. Finally, the experimental observations
are supported by multiscale modeling that has thrown light into the
underlying mechanisms of graphene growth.