1976
DOI: 10.1016/0040-6090(76)90028-6
|View full text |Cite
|
Sign up to set email alerts
|

Interface behaviour evaluation in Au/Cr, Au/Ti and Au/Pd/Ti thin films by means of resistivity and stylus measurements

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
14
0

Year Published

1983
1983
2015
2015

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 21 publications
(14 citation statements)
references
References 4 publications
0
14
0
Order By: Relevance
“…As it can be observed using scanning electron microscopy, the polysilicon etching was not properly performed at the wafer level (Figure 7a). This could be related to the fact that a non-defined gold layer was deposited because of the well-known bad and weak adherence between gold and silicon [35][36][37], as gold has acted as a mask during the polysilicon dry etching and homogenous edges were necessary to clearly define the devices. After the wafer release the bad adherence of gold over the silicon layer was highly demonstrated, this fact can be seen on figure 7b and c, where the polysilicon and gold layers were completely separated.…”
Section: Polysilicon-gold Chips Fabrication Resultsmentioning
confidence: 99%
See 3 more Smart Citations
“…As it can be observed using scanning electron microscopy, the polysilicon etching was not properly performed at the wafer level (Figure 7a). This could be related to the fact that a non-defined gold layer was deposited because of the well-known bad and weak adherence between gold and silicon [35][36][37], as gold has acted as a mask during the polysilicon dry etching and homogenous edges were necessary to clearly define the devices. After the wafer release the bad adherence of gold over the silicon layer was highly demonstrated, this fact can be seen on figure 7b and c, where the polysilicon and gold layers were completely separated.…”
Section: Polysilicon-gold Chips Fabrication Resultsmentioning
confidence: 99%
“…Polysilicon and gold as device materials were selected because of their high versatility and wellknown orthogonal chemistry. However, the well-known weak adhesion of metallic gold to silicon substrates [35][36][37] limits its use in this type of devices. To circumvent this fabrication issue, a chromium interlayer was selected to be deposited in between, due to its well-known adherent properties and its high resistance to HF-wet etchings.…”
Section: Discussionmentioning
confidence: 99%
See 2 more Smart Citations
“…22,[27][28][29][30][31][32][33][34][35] In most of these it is found that Ti reacts with both the substrate and the ambient as well as with Au. 22,[27][28][29][30][31][32][33][34][35] In most of these it is found that Ti reacts with both the substrate and the ambient as well as with Au.…”
Section: Discussionmentioning
confidence: 99%