2019
DOI: 10.1002/adma.201803515
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Interface and Defect Engineering for Metal Halide Perovskite Optoelectronic Devices

Abstract: Metal halide perovskites have been in the limelight in recent years due to their enormous potential for use in optoelectronic devices, owing to their unique combination of properties, such as high absorption coefficient, long charge‐carrier diffusion lengths, and high defect tolerance. Perovskite‐based solar cells and light‐emitting diodes (LEDs) have achieved remarkable breakthroughs in a comparatively short amount of time. As of writing, a certified power conversion efficiency of 22.7% and an external quantu… Show more

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Cited by 342 publications
(279 citation statements)
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References 239 publications
(308 reference statements)
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“…Ag was used as the metal electrode, in which case the migration of I − toward the electrode to deplete the stoichiometry of the perovskite and the corrosion of the electrode by AgI formation is expected to be the major cause of device degradation, [37,54,55] while the more thermally stable poly[bis(4-phenyl)(2,4,6-trimethylphenyl) amine] (PTAA) was used as the hole transporting layer (HTL) to replace spiro-MeOTAD. [8,30,37,57,58] The AceMA device was seen to have significantly improved thermal stability, and retained almost 92% of its initial PCE after over 450 h of continuous heating. In contrast, the reference MA device degraded to just 1.6% of its initial PCE over the same time period.…”
Section: Doi: 101002/adma201906995mentioning
confidence: 96%
“…Ag was used as the metal electrode, in which case the migration of I − toward the electrode to deplete the stoichiometry of the perovskite and the corrosion of the electrode by AgI formation is expected to be the major cause of device degradation, [37,54,55] while the more thermally stable poly[bis(4-phenyl)(2,4,6-trimethylphenyl) amine] (PTAA) was used as the hole transporting layer (HTL) to replace spiro-MeOTAD. [8,30,37,57,58] The AceMA device was seen to have significantly improved thermal stability, and retained almost 92% of its initial PCE after over 450 h of continuous heating. In contrast, the reference MA device degraded to just 1.6% of its initial PCE over the same time period.…”
Section: Doi: 101002/adma201906995mentioning
confidence: 96%
“…The defects in perovskite films exert a dominating influence on the photovoltaic parameters of PSCs including the open‐circuit voltage ( V oc ), short‐circuit current density ( J sc ), and fill factor (FF). [ 29–31 ] When PSCs are under operation, the electrons are excited into the conduction band under light illumination, tearing the internal quasi‐Fermi levels in the perovskite layer, which is the origin of the V oc . [ 32 ] However, free carriers can be trapped by defects for nonradiative recombination, reducing the charge density and ultimately inducing a decrease in V oc .…”
Section: Introductionmentioning
confidence: 99%
“…[8] To further improve the efficiency and long-term stability of PSCs, researchers have explored various interlayers inserting into the basic "n-i-p" or "p-i-n" structure from the perspective of interface engineering. [9][10][11] Beyond the rapidly increased PCE, improving the device stability to meet the requirement of practical application remains as one of the major topics of PSCs development, since there is still a long distance from the required 20-25 years' operation lifetime for photovoltaic applications. [12] To date, many works have been dedicated to revealing failure mechanisms of PSCs.…”
Section: Doi: 101002/aenm202001610mentioning
confidence: 99%