2008 First International Conference on Emerging Trends in Engineering and Technology 2008
DOI: 10.1109/icetet.2008.12
|View full text |Cite
|
Sign up to set email alerts
|

Interconnect Slew Metric Using Nakagami-M Distribution

Abstract: Slew rate determines the ability of a device to handle the varying signals. Determination of the slew rate to a good proximity is thus essential for efficient design of high speed CMOS integrated circuits. This in turn reduces the output switching surges in the device. Interconnect slew has become a crucial bottleneck for any high density and high speed VLSI circuits. In this paper we have proposed an accurate and efficient model to compute the slew metric of on chip interconnect of high speed CMOS VLSI deigns… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 12 publications
(9 reference statements)
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?