1968
DOI: 10.1002/pssb.19680270154
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Interband Faraday Rotation and Ellipticity Observed at the Absorption Edge in Silicon

Abstract: The Faraday rotation and ellipticity in semiconductors, especially near the absorption edge, are related to the band structure. It has been concluded from absorption measurements (1) that in Si the indirect transitions are responsible for the absorption at the edge.The Faraday rotation and ellipticity have been measured in a number of n-type and p-type silicon samples. A summary of the sample properties is presented in Table 1. The investigations were made at room temperature in weak magnetic fields up to 25 k… Show more

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Cited by 8 publications
(2 citation statements)
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“… 1 ) 5300 1 CdTe 2.7 × 10 3 (see ref. 94 ) 775 94 Si 30 95 1050 95 EuS 4.6 × 10 5 (see ref. 96 ) 560 96 Typical Verdet constants of 2D magnetic materials Cr 2 Te 2 Ge 6 1.4 × 10 5 (see ref.…”
Section: Discussionmentioning
confidence: 99%
“… 1 ) 5300 1 CdTe 2.7 × 10 3 (see ref. 94 ) 775 94 Si 30 95 1050 95 EuS 4.6 × 10 5 (see ref. 96 ) 560 96 Typical Verdet constants of 2D magnetic materials Cr 2 Te 2 Ge 6 1.4 × 10 5 (see ref.…”
Section: Discussionmentioning
confidence: 99%
“…In one of the first papers (Rosenberg et al, 1964) it was shown that the Faraday rotation can be resonantly enhanced by a FabryPerot resonator. The importance of considering the effects of internal multiple reflections in the measurements of the Faraday rotation angle was noted by the authors (Piller 1966;Rheinhlander et al, 1975;Stramska et al 1968;Srivastava et al, 1975;Vorobev et al, 1972).…”
Section: Introductionmentioning
confidence: 99%