Abstract:The vapors of tetradecane (C14H30) were ionized by an electron bombardment method. Fragment ions such as C3H7, C6H13 and C12H25 ions were separated by E B filter (Wien filter), and accelerated toward the Si(100) substrates. Thickness measurement showed that thin films were deposited on the Si substrates by C3H7 and C6H13 ion irradiation, although Si substrate surface was sputtered by C12H25 ion irradiation. RBS measurement showed that the irradiation damage by the fragment ion beams decreased with increasing… Show more
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