Interaction of Lomer–Cottrell locks with screw dislocations

Schoeck, G.

doi:10.1080/14786430903193274

Cited by 9 publications

(1 citation statement)

References 15 publications

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“…These defects are unmovable at room temperature and work as the accumulation areas of the high density of SF and dislocations and cause microstrain fields and agglomerates of the microstructure defects during further deformation and hence the work hardening. The LC lock arises from the cutting of two SF on different {111} planes . The SF tetrahedron forms by the cutting of the SF on several {111} lattice planes; the sides of SF tetrahedron are formed by SF .…”

Section: Microstructure Defects and Their Configurationsmentioning

confidence: 99%

Microstructure Defects Contributing to the Energy Absorption in CrMnNi TRIP Steels

et al. 2013

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Freiberg for the hot rolled TRIP steel samples. For the metallographic sample preparation we would like to thank Mrs. Dipl.-Ing. A. Mueller, Mrs. K. Becker; for the conventional preparation of TEM samples and the FIB preparation of TEM samples on Infineon, Dresden we would like to thank Mrs. Dipl.-Ing. A. Leuteritz.Microstructure defects control the TRIP effect and/or the TWIP effect and contribute significantly to the absorption of deformation energy in plastically deformed austenitic CrMnNi steels. In this study, the propagation and interaction of dislocations, stacking faults and twins connected with the formation of Lomer-Cottrell locks, stacking fault tetrahedra, dislocation clusters, deformation bands, microtwins with high-energy incoherent twin boundaries and the nucleation of a 0martensite in the areas of the high local lattice strain due to the fluctuation of the stacking fault density and the lattice shearing, were analysed in the CrMnNi TRIP steel after different deformation extents via transmission electron microscope with high resolution and via scanning electron microscope. ADVANCED ENGINEERING MATERIALS 2013, 15, No. 7

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Section: Microstructure Defects and Their Configurationsmentioning

confidence: 99%