2010
DOI: 10.1103/physrevb.82.125458
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Interaction of gold nanotubes with the Si(211) surface: A density functional study

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Cited by 9 publications
(13 citation statements)
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“…Within the long-wavelength approximation, the high-temperature relaxation time for piezoelectric scattering can be calculated together with the acoustic phonon scattering as 130 1 Electrons in semiconductors, especially in the inversion layer of electrically gated FET channels, can excite phonons in the surrounding dielectrics via long-range Coulomb interactions, if the dielectrics support polar vibrational modes, as shown in Fig 10d. They are long recognized as 'remote interface phonons' (RIP) or 'surface optical phonons' (SOP) and exist in dielectrics near the inversion layers in silicon 243,244 , organic FETs, [245][246][247] and graphene. [248][249][250][251][252][253] The RIP scattering may not be a significant scattering mechanism in low-field transport or in FETs using low-κ dielectrics, but it can become important at high fields, 253 large inversion densities or high-κ dielectric surroundings, as pointed out by Moore et al 243,244 Experimental studies on organic FETs indicate that the use of high κ dielectric degrades FET carrier mobility. [245][246][247] Table 4 lists the RIP modes for commonly used dielectrics, which are useful for theoretical calculation and device design.…”
Section: Fröhlich and Piezoelectric Interactionsmentioning
confidence: 99%
“…Within the long-wavelength approximation, the high-temperature relaxation time for piezoelectric scattering can be calculated together with the acoustic phonon scattering as 130 1 Electrons in semiconductors, especially in the inversion layer of electrically gated FET channels, can excite phonons in the surrounding dielectrics via long-range Coulomb interactions, if the dielectrics support polar vibrational modes, as shown in Fig 10d. They are long recognized as 'remote interface phonons' (RIP) or 'surface optical phonons' (SOP) and exist in dielectrics near the inversion layers in silicon 243,244 , organic FETs, [245][246][247] and graphene. [248][249][250][251][252][253] The RIP scattering may not be a significant scattering mechanism in low-field transport or in FETs using low-κ dielectrics, but it can become important at high fields, 253 large inversion densities or high-κ dielectric surroundings, as pointed out by Moore et al 243,244 Experimental studies on organic FETs indicate that the use of high κ dielectric degrades FET carrier mobility. [245][246][247] Table 4 lists the RIP modes for commonly used dielectrics, which are useful for theoretical calculation and device design.…”
Section: Fröhlich and Piezoelectric Interactionsmentioning
confidence: 99%
“…However, the presence of a supporting dielectric substrate significantly reduces the low-field mobility in graphene due to the influence of surface polar phonon (SPP) scattering. [2][3][4][5] While the low-field mobility is reduced, the saturation velocity can be enhanced in supported graphene samples due to the strongly anisotropic nature of SPP scattering. 6 SPP scattering can be also determinant in graphene channels, strongly affecting the current saturation.…”
mentioning
confidence: 99%
“…The scattering rates for acoustic and optical phonons considered are derived from ab initio calculations. 15 The anisotropic, inelastic SPP scattering 3,4,6 is implemented in the model taking into account the Fröhlich nature of this kind of interaction, by properly accounting for the angle dependence of the scattering probability integrand. The values of the phonon energies and the low and high frequency dielectric constants for the different substrate materials considered are shown in Table I.…”
mentioning
confidence: 99%
“…[ 143 ] Simulations have shown that high dielectric constant (high-k) materials like these should suppress charged impurity scattering in the underlying graphene, and thus enhance carrier mobility. [144][145][146] Hollander et al [ 147 ] demonstrated a 70% increase in carrier mobility in graphene transistor structures when employing ALD dielectric overlayers in which high-k dielectric seed layers were deposited directly onto epitaxial graphene.…”
Section: Summary Of Literature On Graphene Barrier Layer Experimentsmentioning
confidence: 99%