2012
DOI: 10.1103/physrevlett.108.181101
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Interaction between Stray Electrostatic Fields and a Charged Free-Falling Test Mass

Abstract: We present an experimental analysis of force noise caused by stray electrostatic fields acting on a charged test mass inside a conducting enclosure, a key problem for precise gravitational experiments. Measurement of the average field that couples to test mass charge, and its fluctuations, is performed with two independent torsion pendulum techniques, including direct measurement of the forces caused by a change in electrostatic charge. We analyze the problem with an improved electrostatic model that, coupled … Show more

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Cited by 60 publications
(69 citation statements)
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“…When considered with the uncompensated values measured for Δ x , roughly −20 mV and 0 mV for TM 1 and TM 2, the stray fields in the GRS would seem to be similar in magnitude to those observed in various measurements on GRS prototype hardware on ground [2,30,31]. Small but significant changes in Δ x are observed for the two TMs, consistent with drifts of slightly less than mV/month, roughly an order of magnitude below typical drift values observed, for a limited number of samples, on ground [2,32].…”
Section: =2supporting
confidence: 56%
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“…When considered with the uncompensated values measured for Δ x , roughly −20 mV and 0 mV for TM 1 and TM 2, the stray fields in the GRS would seem to be similar in magnitude to those observed in various measurements on GRS prototype hardware on ground [2,30,31]. Small but significant changes in Δ x are observed for the two TMs, consistent with drifts of slightly less than mV/month, roughly an order of magnitude below typical drift values observed, for a limited number of samples, on ground [2,32].…”
Section: =2supporting
confidence: 56%
“…Δ x originates both from surface patch potentials within the sensor and the GRS electronics. Measurements with representative systems in laboratory tests have found static levels of up to 100 mV [2,[30][31][32]. Tests on a representative electronics unit measured S 1=2 Δ x coming from electrodevoltage fluctuations to be 30 μV Hz −1=2 at 1 mHz [19].…”
Section: =2mentioning
confidence: 99%
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