2012
DOI: 10.1134/s0020168512030144
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Interaction between multiply charged manganese nanoclusters and sulfur atoms in silicon

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Cited by 6 publications
(3 citation statements)
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“…One can assume that dark current in the forward connection mode, by and large, might be due to the fact that current carriers are possibly being injected from contact points. At voltage "switched-on" mode, electrons are caught at level Ei = 0.4 eV, since their concentration at level 0.25 eV is comparatively low, and at this section the investigated photocurrent is determined by holes [9,10].…”
Section: Resultsmentioning
confidence: 99%
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“…One can assume that dark current in the forward connection mode, by and large, might be due to the fact that current carriers are possibly being injected from contact points. At voltage "switched-on" mode, electrons are caught at level Ei = 0.4 eV, since their concentration at level 0.25 eV is comparatively low, and at this section the investigated photocurrent is determined by holes [9,10].…”
Section: Resultsmentioning
confidence: 99%
“…Having analyzed and summarizing the above experimental data one can tentatively assume that at direct switching mode of the diode structure, we are witnessing the so-called effect of negative photoconductivity due to the process of injection of current carriers associated with level E = 0.4 eV [8][9][10][11][12]. Under constant illumination, photoconductivity starts at Ei0.26 eV and decreases within the 0.4 eV range with a relatively sharp minimum at E  0.52 eV, where the effect of infrared quenching of photoconductivity occurs.…”
Section: Resultsmentioning
confidence: 99%
“…Если подобное предложение подтвердится, а под этим можно подразумевать, что тетраэдрическая s 1 p 3 гибридная связь бинарных соединений, образованных в структуре базового монокристального кремния, не нарушает структуру кристаллической решетки и приводит к образованию элементарных бинарных ячеек с новыми ионно-ковалентными связами, то примесные атомы серы и цинка в узлах кристаллической решетки кремния будут находиться рядом друг с другом и образовывать достаточно сильные внутренние электрические и деформационные поля, таким образом формируя в целом нейтральные бинарные соединения типа S 0 -e-S + , S + -e-S ++ , Zn + e -Zn и Zn -+e -Zn. Замечено, что в случае диффузии атомов серы и цинка в объеме кремния в отдельности примесные атомы серы создают два донорных, а атомы цинка два акцепторных глубоких уровня в запрещенной зоне кремния [10,11]…”
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