2016
DOI: 10.1063/1.4948953
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Intensity-dependent nonlinearity of the lateral photoconductivity in InGaAs/GaAs dot-chain structures

Abstract: Photoelectric properties of laterally correlated multilayer InGaAs/GaAs quantum dots (QDs) heterostructures are studied. The response of the photocurrent to increasing excitation intensity is found to be nonlinear and varying with excitation energy. The structures are photosensitive in a wide range of photon energies above 0.6 eV. The spectral dependence of the photoconductivity (PC) is caused by strong interaction between the bulk GaAs and the lower energy states of the wetting layer, the QDs, as well as the … Show more

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Cited by 16 publications
(32 citation statements)
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“…3). As well the onset of both the absorption spectra at 0.68 eV, we attribute to the transition from EL2 defect center to the conduction band considering the possible way through the shallow defect levels [2427, 29]. Similar redshift of EL2-related bands in optical transition have been described for InGaAs/GaAs nanostructures [27, 30].…”
Section: Discussionsupporting
confidence: 69%
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“…3). As well the onset of both the absorption spectra at 0.68 eV, we attribute to the transition from EL2 defect center to the conduction band considering the possible way through the shallow defect levels [2427, 29]. Similar redshift of EL2-related bands in optical transition have been described for InGaAs/GaAs nanostructures [27, 30].…”
Section: Discussionsupporting
confidence: 69%
“…As well the onset of both the absorption spectra at 0.68 eV, we attribute to the transition from EL2 defect center to the conduction band considering the possible way through the shallow defect levels [2427, 29]. Similar redshift of EL2-related bands in optical transition have been described for InGaAs/GaAs nanostructures [27, 30]. However, the fact that no signal below QD spectral band is observed in the PV spectra from only MBE layers means a low amount of EL2-like non-radiative recombination centers in the metamorphic and GaAs buffers overall, providing the effective detection of photocarriers coming from even a single layer of QDs, whereas the high density of recombination centers in the GaAs substrates and n + -GaAs layers of the structures under investigation has been confirmed by the PV characterization of samples measured through the substrate (inset in Fig.…”
Section: Discussionmentioning
confidence: 99%
“…The onset at 0.72 eV is attributed to the transition from the EL2 defect center located in si -GaAs substrate and related interfaces near 0.75 eV below the GaAs conduction band [ 57 ], taking into account the possibility of transition through the shallow levels of defects [ 46 , 54 , 55 ]. The aspects related to their location as well as the EL2 PC onset redshift have been discussed in detail elsewhere [ 10 , 45 ]. As no signal underneath the QD-related bands was observed in the spectra of the samples contacted to the InGaAs or GaAs buffers (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Vertical photocurrent and PV spectra were measured in the 0.6 to 1.8 eV range using normal incidence excitation geometry at room temperature (RT) (300 K) and same light source intensity (1.5 mW/cm 2 ). The photocurrent was measured using a current amplifier and direct current technique [ 10 , 43 45 ], with 1 V bias. The current was measured as a voltage signal drop across a series load resistance of 100 kΩ (see the inset in Fig.…”
Section: Methodsmentioning
confidence: 99%
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