2018
DOI: 10.1007/s00289-018-2274-5
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Integration of Zn-doped organic polymer nanocomposites between metal semiconductor structure to reveal the electrical qualifications of the diodes

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Cited by 21 publications
(6 citation statements)
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“…Some clues for elucidation of the physical processes that are responsible for the J r and J nr discrepancies between P-QLEDs and C-QLEDs are contained in the parameter values in table 1. For example, unusually large ideality factors for both devices indicates that barrier-height effects and/or defect-related losses significantly affect the performance of these devices [42][43][44]. Specifically, the reduction of n nr from 19.0 to 12.8, which is responsible for the noticeable increase of J nr in spite of a three-fold decrease in pre-exponential factor J 0,nr (from 1.11×10 -8 to 3.58×10 -9 mA cm −2 ), can be attributed to the reduction of barrier heights due to a Fermi level shift and concomitant passivation of mid-gap defect states as a result of Cs 2 CO 3 treatment.…”
Section: Resultsmentioning
confidence: 99%
“…Some clues for elucidation of the physical processes that are responsible for the J r and J nr discrepancies between P-QLEDs and C-QLEDs are contained in the parameter values in table 1. For example, unusually large ideality factors for both devices indicates that barrier-height effects and/or defect-related losses significantly affect the performance of these devices [42][43][44]. Specifically, the reduction of n nr from 19.0 to 12.8, which is responsible for the noticeable increase of J nr in spite of a three-fold decrease in pre-exponential factor J 0,nr (from 1.11×10 -8 to 3.58×10 -9 mA cm −2 ), can be attributed to the reduction of barrier heights due to a Fermi level shift and concomitant passivation of mid-gap defect states as a result of Cs 2 CO 3 treatment.…”
Section: Resultsmentioning
confidence: 99%
“…Φ b is effective barrier height. The value n is calculated from the slope of the semi-logarithmic I-V graphs obtained [39][40][41][42][43][44][45][46][47][48].…”
Section: Resultsmentioning
confidence: 99%
“…The resistance and doped-polymer interlayer are essential components of the MPS structure. Because both the series resistance and the depletion layer share the total voltage applied to the structures (Tecimer et al, 2018). As a result, the quality of the interlayer and the series resistance were an essential impact on the dependability and usefulness of these devices (Zeyrek et al, 2013).…”
Section: Introductionmentioning
confidence: 99%