2012
DOI: 10.1049/mnl.2011.0670
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Integrated SICM-AFM-optical microscope to measure forces due to hydrostatic pressure applied to a pipette

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Cited by 17 publications
(14 citation statements)
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“…4,[11][12][13][14] Both techniques have also been combined. 9,15,16 The imaging mechanism in AFM is based on mechanical forces between the sample and the tip of a cantilever, which is used to track the surface of the sample (Fig. 1a).…”
Section: Introductionmentioning
confidence: 99%
“…4,[11][12][13][14] Both techniques have also been combined. 9,15,16 The imaging mechanism in AFM is based on mechanical forces between the sample and the tip of a cantilever, which is used to track the surface of the sample (Fig. 1a).…”
Section: Introductionmentioning
confidence: 99%
“…For example, SICM-AFM, employs a bent nanopipette to serve as both a cantilever and also as an open channel to probe conductance. This type of device has been used for both conductance-topography [146] and topography-force measurements [147,148]. The use of confocal microscopy in tandem with SICM has allowed the simultaneous collection of sample topography and imaging of the spatial distribution of fluorescent molecules or particles of interest [149].…”
Section: (D) Scanning Electrochemical Microscopy-scanning Ion Conductmentioning
confidence: 99%
“…Therefore, it is well suited to probe soft and responsive surfaces such as those on living cells. The applied pressure is only a few hundred Pa and results from hydrostatic pressure of the fill level of the nanopipette [20]. The ion current drops with probe-sample approach, because the effective area for the ion trajectories becomes smaller, referred to as current squeezing.…”
Section: Introductionmentioning
confidence: 99%