2020
DOI: 10.1116/6.0000089
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Integrated in situ self-aligned double patterning process with fluorocarbon as spacer layer

Abstract: Self-aligned double patterning (SADP), or spacer lithography, is a widely used technique in the semiconductor industry for high-throughput nanoscale pattern definition and thus is of great significance for very-large-scale integration, large-area photonic device fabrications, and other applications. In a standard SADP flow, chemical vapor deposition or atomic layer deposition is used to deposit a conformal spacer layer, which is typically a dielectric material. The spacer composition and film quality will infl… Show more

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Cited by 6 publications
(4 citation statements)
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References 28 publications
(30 reference statements)
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“…Firstly, PPFC is deposited on a pristine Si wafer by C 4 F 8 -based plasma with a commercially available plasma etching system (a), the deposition mechanism is similar as a plasmaenhanced chemical vapor deposition (PECVD) process and has been investigated in previous studies by the authors. [16] Before further processes, the samples are baked above the glass transition temperature of PPFC (around 115 • C [17]) to reduce the surface roughness and the primary polymers on the PPFC surface. Patterns are then defined with standard UV lithography method (b1/b2), and PPFC is not dissolved or eroded by photoresist or developer due to its chemical inertness.…”
Section: Resultsmentioning
confidence: 99%
“…Firstly, PPFC is deposited on a pristine Si wafer by C 4 F 8 -based plasma with a commercially available plasma etching system (a), the deposition mechanism is similar as a plasmaenhanced chemical vapor deposition (PECVD) process and has been investigated in previous studies by the authors. [16] Before further processes, the samples are baked above the glass transition temperature of PPFC (around 115 • C [17]) to reduce the surface roughness and the primary polymers on the PPFC surface. Patterns are then defined with standard UV lithography method (b1/b2), and PPFC is not dissolved or eroded by photoresist or developer due to its chemical inertness.…”
Section: Resultsmentioning
confidence: 99%
“…The deposition rate is estimated to be around 400 nm/min, which is measured by a spectroscopic ellipsometry system (Ellipsometer VASE, J. A. Woolam), and the PPFC deposition mechanism has been discussed in detail in previous studies [16]. Thermal treatments were performed by a hotplate with various temperatures.…”
Section: Methodsmentioning
confidence: 99%
“…Normally, these processes apply liquid-based ink solutions, which can be transported to substrate surfaces by chemical bonds, diffusions, or fluid dynamical processes, and sub-micrometer feature sizes have been demonstrated on a wafer scale. Specifically, PPL has attracted a lot of research interests by combining μCP and dip pen lithography (DPL), , and multiple modified versions have been developed on the basis of novel ink materials or new duplication mechanisms. …”
Section: Introductionmentioning
confidence: 99%