Integrated diagnostics from a concurrent engineering perspective

Giordano, P.; Nolan, Mike

doi:10.1109/autest.1990.111565

IEEE Conference on Systems Readiness Technology, 'Advancing Mission Accomplishment'.

DOI: 10.1109/autest.1990.111565

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Integrated diagnostics from a concurrent engineering perspective

P. Giordano¹,

Mike Nolan²

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