2019
DOI: 10.1007/s10854-019-02290-0
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Insulator–metal transition and ultrafast crystallization of Ga40Sb60/Sn15Sb85 multiple interfacial nanocomposite films

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Cited by 6 publications
(1 citation statement)
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“…Correspondingly, the surface roughness of the film increases from 0.2228 nm in the deposited state to 0.4879 nm at 142 • C, indicating that the surface fluctuation becomes larger due to the growth of the grains. However, the surface is still relatively flat in the crystal state, which is beneficial to maintain the effective contact between the electrode and the film, and helps to improve the reliability of the device [28]. Figure 7i-l show the surface potential of the thin film.…”
Section: Resultsmentioning
confidence: 99%
“…Correspondingly, the surface roughness of the film increases from 0.2228 nm in the deposited state to 0.4879 nm at 142 • C, indicating that the surface fluctuation becomes larger due to the growth of the grains. However, the surface is still relatively flat in the crystal state, which is beneficial to maintain the effective contact between the electrode and the film, and helps to improve the reliability of the device [28]. Figure 7i-l show the surface potential of the thin film.…”
Section: Resultsmentioning
confidence: 99%