Insulation Resistance and Tracking Index of Circuit Breaker According to the Accelerated Aging Test
Sin-Dong Kang,
Jae-Ho Kim
Abstract:This study examined insulation resistance and tracking index characteristics through the accelerated aging test of low-voltage circuit breakers. The leakage current was found to be influenced by external factors rather than the internal structure. Additionally, the insulation resistance of the circuit breakers undergoing accelerated degradation was measured using a Megger insulation tester. In the case of a circuit breaker manufactured using the accelerated aging test, the insulation resistance increased compa… Show more
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