2013
DOI: 10.1063/1.4808055
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Instrumentation of broadband frequency domain thermoreflectance for measuring thermal conductivity accumulation functions

Abstract: This paper describes the instrumentation for broadband frequency domain thermoreflectance (BB-FDTR), a novel, continuous wave laser technique for measuring the thermal conductivity accumulation function. The thermal conductivity accumulation function describes cumulative contributions to the bulk thermal conductivity of a material from energy carriers with different mean free paths. It can be used to map reductions in thermal conductivity in nano-devices, which arise when the dimensions of the device are comme… Show more

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Cited by 76 publications
(60 citation statements)
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“…Key examples of scalable sources include laser interference patterns used by transient thermal grating (TTG) [2][3][4], metal nanogratings employed by soft x-ray metrology [5,6] and two-tint time domain thermoreflectance (TDTR) [7], and TDTR laser spot diameter [8,9]. The characteristic length scale of the thermal gradient can also be varied indirectly, as is done in time/frequency domain thermoreflectance (TDTR/FDTR) through the pump laser modulation frequency [9][10][11][12][13].…”
Section: Introductionmentioning
confidence: 99%
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“…Key examples of scalable sources include laser interference patterns used by transient thermal grating (TTG) [2][3][4], metal nanogratings employed by soft x-ray metrology [5,6] and two-tint time domain thermoreflectance (TDTR) [7], and TDTR laser spot diameter [8,9]. The characteristic length scale of the thermal gradient can also be varied indirectly, as is done in time/frequency domain thermoreflectance (TDTR/FDTR) through the pump laser modulation frequency [9][10][11][12][13].…”
Section: Introductionmentioning
confidence: 99%
“…However, BTE solutions are formulated in terms of a wide spectrum of phonon modes and as such are too intricate and inflexible for direct processing of experimental data. Instead, nearly all measurements of inherently nondiffusive heat dynamics are analysed using conventional diffusive theory and interpreted in terms of 'effective' Fourier thermal conductivities/resistivities [3][4][5][6][7][8][9][10][11][12]. Several of our prior works [13,25] have pointed out substantial artifacts induced by this methodology, and other community members have joined in expressing the growing need for 'beyond Fourier' characterisation frameworks [6,26].…”
Section: Introductionmentioning
confidence: 99%
“…Likewise, the k th values of Au were calculated from the Au sheet resistance as measured by 4-point probe measurements for separate Au films deposited on 1 lm-thick thermally grown SiO 2 films on Si substrates following the Weidemann Franz Law. The k th value of n-type Si substrates were found to be 95 6 10 W/m-K, which appears low relative to the bulk value (143 W/m-K) for Si, but is reasonably attributed to the known suppression in k th observed by high frequency FDTR measurements 17,18 paired with effects of added phonon scattering due to phosphorous dopant concentration of about 10 15 Table I. These values were averaged over 3 measurements at 3 locations on the samples.…”
mentioning
confidence: 99%
“…The thermal conductivities of the film stacks in the direction normal to the layers were characterized using the FrequencyDomain Thermoreflectance (FDTR) technique, [16][17][18][19] as illustrated in Figure 1(c), and we take those to be representative of the in-plane thermal conductivity of granular films when the lateral grain size is similar to the FePt thickness in the model samples. To estimate the effect of media grain size on the inplane lateral thermal conduction, the thickness of FePt layer was varied from 14.5 nm to 29 nm.…”
mentioning
confidence: 99%
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