Surface Microscopy With Low Energy Electrons 2014
DOI: 10.1007/978-1-4939-0935-3_3
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Cited by 3 publications
(3 citation statements)
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“…LEEM and LEED, as well as X-ray photo-emission electron microscopy (XPEEM) experiments, were carried out using the spectroscopic photoemission and low-energy electron microscope (SPELEEM). This instrument combines the structural information from LEEM and LEED with the chemical/magnetic sensitivity of XPEEM. , The lateral resolution was around 10 nm in LEEM mode and 30 nm in XPEEM. , The energy resolution in photoemission experiments was about 0.15 eV.…”
Section: Methodsmentioning
confidence: 99%
“…LEEM and LEED, as well as X-ray photo-emission electron microscopy (XPEEM) experiments, were carried out using the spectroscopic photoemission and low-energy electron microscope (SPELEEM). This instrument combines the structural information from LEEM and LEED with the chemical/magnetic sensitivity of XPEEM. , The lateral resolution was around 10 nm in LEEM mode and 30 nm in XPEEM. , The energy resolution in photoemission experiments was about 0.15 eV.…”
Section: Methodsmentioning
confidence: 99%
“…The experiments have been performed using a spin-polarized electron microscope (SPLEEM 28 ) of the National Center for Electron Microscopy, part of the Molecular Foundry in the Lawrence Berkeley National Laboratory. This instrument 29 allows acquisition of low-energy electron images with magnetic contrast using a spin-polarized electron beam for illumination, whose spin orientation can be selected along any desired direction.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…We employed XPEEM to probe the surface chemistry and electronic structure of the samples at the nanoscale. XPEEM is strongly surface-selective.…”
Section: Methodsmentioning
confidence: 99%