Insights into the Exceptional Crystallographic Order of Biominerals Using Dark-Field X-ray Microscopy

Cook, Phil; Simons, Hugh; Jakobsen, Anders Clemen; Yildirim, Can; Poulsen, Henning Friis; Detlefs, C.

doi:10.1017/s1431927618012837

Cited by 10 publications

(7 citation statements)

References 6 publications

(4 reference statements)

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“…The first implementation of a dedicated dark-field X-ray microscope was recently installed on beamline ID06-HXM of the European Synchrotron Radiation Facility (Kutsal et al, 2019). Since its installation, this instrument has been used to investigate a variety of scientific subjects, including the domain evolution in ferroelectrics (Simons et al, 2018), the austenitic transformation in shape memory alloys (Bucsek et al, 2019), recovery in metals (Mavrikakis et al, 2019;Ahl et al, 2020), embedded particles in steel (Hlushko et al, 2020), visualization of dislocation structures (Jakobsen et al, 2019;Dresselhaus-Marais et al, 2021a) and the structure of biominerals (Cook et al, 2018;Schoeppler et al, 2022).…”

Section: Introductionmentioning

confidence: 99%

darfix – data analysis for dark-field X-ray microscopy

Ferrer¹,

Rodríguez-Lamas²,

Payno³

et al. 2023

J Synchrotron Rad

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A Python package for the analysis of dark-field X-ray microscopy (DFXM) and rocking curve imaging (RCI) data is presented. DFXM is a non-destructive diffraction imaging technique that provides three-dimensional maps of lattice strain and orientation. The darfix package enables fast processing and visualization of these data, providing the user with the essential tools to extract information from the acquired images in a fast and intuitive manner. These data processing and visualization tools can be either imported as library components or accessed through a graphical user interface as an Orange add-on. In the latter case, the different analysis modules can be easily chained to define computational workflows. Operations on larger-than-memory image sets are supported through the implementation of online versions of the data processing algorithms, effectively trading performance for feasibility when the computing resources are limited. The software can automatically extract the relevant instrument angle settings from the input files' metadata. The currently available input file format is EDF and in future releases HDF5 will be incorporated.

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Section: Introductionmentioning

confidence: 99%

darfix – data analysis for dark-field X-ray microscopy

Ferrer¹,

Rodríguez-Lamas²,

Payno³

et al. 2023

J Synchrotron Rad

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“…High energy X-rays also have large extinction lengths, which limits dynamical diffraction (i.e., multiple scattering) and simplifies experiment design and interpretation. DFXM has been employed in the study of ferroelectrics [8] and biominerals [9], and recently has been applied to analyze populations of dislocations [10][11][12][13].…”

Section: Introductionmentioning

confidence: 99%

Analytical Methods for Superresolution Dislocation Identification in Dark-Field X-ray Microscopy

Brennan,

Howard,

Marzouk

et al. 2022

Preprint

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“…Dark-field x-ray microscopy (DFXM), analogous to its TEM counterpart, was recently developed to directly map the subtle deformations surrounding defects and boundaries beneath a material's surface, giving providing views of the microstructure that were previously inaccessible (31). While DFXM has addressed key issues in ferroelectrics (32) and biominerals (33), it has only recently been applied to dislocation studies (34). For materials with sufficiently low dislocation densities, DFXM was demonstrated to resolve single dislocations by mapping the strain fields around dislocation cores (weak-beam contrast) (34,35).…”

Section: Introductionmentioning

confidence: 99%

In situ visualization of long-range defect interactions at the edge of melting

et al. 2021

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Connecting a bulk material’s microscopic defects to its macroscopic properties is an age-old problem in materials science. Long-range interactions between dislocations (line defects) are known to play a key role in how materials deform or melt, but we lack the tools to connect these dynamics to the macroscopic properties. We introduce time-resolved dark-field x-ray microscopy to directly visualize how dislocations move and interact over hundreds of micrometers deep inside bulk aluminum. With real-time movies, we reveal the thermally activated motion and interactions of dislocations that comprise a boundary and show how weakened binding forces destabilize the structure at 99% of the melting temperature. Connecting dynamics of the microstructure to its stability, we provide important opportunities to guide and validate multiscale models that are yet untested.

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Insights into the Exceptional Crystallographic Order of Biominerals Using Dark-Field X-ray Microscopy

Cited by 10 publications

References 6 publications

darfix – data analysis for dark-field X-ray microscopy

darfix – data analysis for dark-field X-ray microscopy

Analytical Methods for Superresolution Dislocation Identification in Dark-Field X-ray Microscopy

In situ visualization of long-range defect interactions at the edge of melting

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