Insight in the outside: materials science at the atomic level using LEIS

Brongersma, H.H.; Ridder, de M Marco; Gildenpfennig, A.; Viitanen, MM Minna

doi:10.1016/s0955-2219(03)00287-5

Cited by 23 publications

(13 citation statements)

References 9 publications

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“…Examples are the use of YSZ as a membrane in solid oxide fuel cells and in oxygen gas sensors. Despite its importance in many fields, its electron insulating property makes surface characterization difficult and consequently there exist only a few surface investigations of YSZ that deal with surface composition and structural characterization [2][3][4][5][6].…”

Section: Introductionmentioning

confidence: 99%

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High temperature scanning tunneling microscopy of purely ion conducting yttria stabilized zirconia (YSZ)

Morrow¹,

Luttrell²,

Carter³

et al. 2009

Surface Science

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Section: Introductionmentioning

confidence: 99%

“…Electrons tunnel from STM tip into the conduction band of the ion conductor (1). The electrons diffuse in the conduction band (2) until they are being trapped(3). Diffusing ions carry the charges to the metal sample holder (4) where the ions oxidize the sample holder.…”

mentioning

confidence: 99%

High temperature scanning tunneling microscopy of purely ion conducting yttria stabilized zirconia (YSZ)

Morrow¹,

Luttrell²,

Carter³

et al. 2009

Surface Science

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“…Beneficial features of ion beam-based techniques include: (1) shallow (surface-sensitive) information depths because ions in the relevant energy ranges do not penetrate into a solid as far as X-ray or electron beams and (2) mass-sensitivity, thus enabling identification of isotopes as well as elements. Indeed, SIMS analysis of 18 O isotopic tracer diffusion profiles in samples having undergone anneals in gaseous 18 O at high temperatures has been used for several decades to derive the tracer oxygen exchange coefficient ( k *) and diffusivity ( D *) in ionic and mixed conductors [ 85 , 86 ]. I 2 CNER in Kyushu University provides a unique environment for ion beam surface analysis.…”

Section: Role Of Surface Chemistrymentioning

confidence: 99%

Roles of Bulk and Surface Chemistry in the Oxygen Exchange Kinetics and Related Properties of Mixed Conducting Perovskite Oxide Electrodes

Perry

Ishihara

2016

Materials

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Mixed conducting perovskite oxides and related structures serving as electrodes for electrochemical oxygen incorporation and evolution in solid oxide fuel and electrolysis cells, respectively, play a significant role in determining the cell efficiency and lifetime. Desired improvements in catalytic activity for rapid surface oxygen exchange, fast bulk transport (electronic and ionic), and thermo-chemo-mechanical stability of oxygen electrodes will require increased understanding of the impact of both bulk and surface chemistry on these properties. This review highlights selected work at the International Institute for Carbon-Neutral Energy Research (I2CNER), Kyushu University, set in the context of work in the broader community, aiming to characterize and understand relationships between bulk and surface composition and oxygen electrode performance. Insights into aspects of bulk point defect chemistry, electronic structure, crystal structure, and cation choice that impact carrier concentrations and mobilities, surface exchange kinetics, and chemical expansion coefficients are emerging. At the same time, an understanding of the relationship between bulk and surface chemistry is being developed that may assist design of electrodes with more robust surface chemistries, e.g., impurity tolerance or limited surface segregation. Ion scattering techniques (e.g., secondary ion mass spectrometry, SIMS, or low energy ion scattering spectroscopy, LEIS) with high surface sensitivity and increasing lateral resolution are proving useful for measuring surface exchange kinetics, diffusivity, and corresponding outer monolayer chemistry of electrodes exposed to typical operating conditions. Beyond consideration of chemical composition, the use of strain and/or a high density of active interfaces also show promise for enhancing performance.

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“…More recently, investigation of the tails in LEIS has been used as a tool for high resolution nondestructive in-depth composition analysis of ultrathin layers [Brongersma et al, 2003] and shallow interfaces [Janssen et al, 2004].…”

Section: Surface Compositionmentioning

confidence: 99%