2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits 2012
DOI: 10.1109/ipfa.2012.6306281
|View full text |Cite
|
Sign up to set email alerts
|

Innovative methodology for failure rate estimation from quality incidents, for ISO26262 standard requirements

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2013
2013
2019
2019

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(2 citation statements)
references
References 8 publications
0
2
0
Order By: Relevance
“…In equation ( 5), P 0 t ð Þ and P t ð Þ stand for the transferred and original reliability matrix which consists of the state events in the Markov chain, each element in P 0 t ð Þ is the differential coefficient of the element in P t ð Þ. For the Markov chain in Figure 8, P 0 t ð Þ and P t ð Þ can be written as formula (6) and formula (7).…”
Section: Modeling Steps Of the Mixed Modelmentioning
confidence: 99%
See 1 more Smart Citation
“…In equation ( 5), P 0 t ð Þ and P t ð Þ stand for the transferred and original reliability matrix which consists of the state events in the Markov chain, each element in P 0 t ð Þ is the differential coefficient of the element in P t ð Þ. For the Markov chain in Figure 8, P 0 t ð Þ and P t ð Þ can be written as formula (6) and formula (7).…”
Section: Modeling Steps Of the Mixed Modelmentioning
confidence: 99%
“…There was also some research on the calculation of an E/E system random hardware failure rate. Berges et al 7 came up with an innovative methodology for failure estimation from quality incidents, with which all of the data on the failures is no longer needed, nor do they sample the non-failing parts still in the field. Das and Taylor 8 drew out several key frameworks for successfully calculating the probabilistic metric for hardware failure using FTA, he used methods drawn from previous literature to organize potential failures within a complex multi-functional system at the top levels of the analysis and considered the effect of all fault categories with appropriate diagnostic coverage and proof-test interval times at the low levels.…”
Section: Introductionmentioning
confidence: 99%