1983
DOI: 10.1016/0022-0248(83)90376-7
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Inner differentiation of growth sectors induced by the interaction between dislocations and sector boundaries in KH2PO4 crystals

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1983
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Cited by 34 publications
(3 citation statements)
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“…The differences consist of slightly lower values for the Bq = D / 3 and BZ = E spin-Hamiltonian parameters, as well as for the ratio 3E/D; moreover, the Z principal axis, defined as the axis exhibiting maximum splitting of the spectrum, is exchanged with the Y axis for Cr3+ in the bulk sample [l, 21. These differences have been interpreted as being a consequence of a slight increase in the lattice parameters in the growth-band samples (GB samples) with respect to the regular samples (R samples). This explanation is supported by the measurement of the c parameter of samples taken from the growth-band region using synchrotron radiation plane-wave reflection topography [3], which shows a relative lattice parameter difference dc/c of around 2 x lo-' with respect to regular (inner) samples. Although the a and b parameters have not been measured in [ 3 ] ,…”
mentioning
confidence: 80%
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“…The differences consist of slightly lower values for the Bq = D / 3 and BZ = E spin-Hamiltonian parameters, as well as for the ratio 3E/D; moreover, the Z principal axis, defined as the axis exhibiting maximum splitting of the spectrum, is exchanged with the Y axis for Cr3+ in the bulk sample [l, 21. These differences have been interpreted as being a consequence of a slight increase in the lattice parameters in the growth-band samples (GB samples) with respect to the regular samples (R samples). This explanation is supported by the measurement of the c parameter of samples taken from the growth-band region using synchrotron radiation plane-wave reflection topography [3], which shows a relative lattice parameter difference dc/c of around 2 x lo-' with respect to regular (inner) samples. Although the a and b parameters have not been measured in [ 3 ] ,…”
mentioning
confidence: 80%
“…This explanation is supported by the measurement of the c parameter of samples taken from the growth-band region using synchrotron radiation plane-wave reflection topography [3], which shows a relative lattice parameter difference dc/c of around 2 x lo-' with respect to regular (inner) samples. Although the a and b parameters have not been measured in [ 3 ] ,…”
mentioning
confidence: 80%
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