17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings.
DOI: 10.1109/dftvs.2002.1173507
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Injecting bit flip faults by means of a purely software approach: a case studied

Abstract: Bit flips provoked by radiation are a main concern for space applications. A fault injection experiment performed using a software simulator is described in this paper. Obtained results allow us to predict a low sensitivity to soft errors for the studied application, putting in evidence critical memory elements

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Cited by 13 publications
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“…Some faults do not appear at the same time they occur. Moreover, faults may occur because hardware or software glitches such as memory bit flipping [17] that may alter the data before making decisions at run time.…”
Section: Fault Modelmentioning
confidence: 99%
“…Some faults do not appear at the same time they occur. Moreover, faults may occur because hardware or software glitches such as memory bit flipping [17] that may alter the data before making decisions at run time.…”
Section: Fault Modelmentioning
confidence: 99%
“…Some stations may also make faulty decisions, because received data may be altered before making decisions at run time. This can happen, because of hardware or software glitches such as memory bit flipping [24].…”
Section: Overview Of Dynamic Schedulesmentioning
confidence: 99%