1999
DOI: 10.1143/jjap.38.1691
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Initialization Characteristics and their Effects on the Erasabilty of Phase Change Optical Disks Using Transmission Electron Microscopy

Abstract: We investigated the microstructure of phase change optical disks subjected to various initialization conditions using transmission electron microscopy (TEM). The effects of initialization powers on the erase ratio of phase change optical disks and corresponding microstructure changes were also studied. It was found that the increase of initialization power enlarged the width of the recrystallization band formed in the recording media of the disk. A wide recrystallization band was effective for decreasing the r… Show more

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Cited by 17 publications
(7 citation statements)
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“…Figure 3 presents the micrograph of signal marks in a recorded disk sample taken by transmission electron microscopy ͑TEM͒ ͑Jeol FX-II 2010͒. 18 Distinct, seashell-like signal marks with various recording lengths can be seen. Selected area electron diffraction ͑SAED͒ patterns taken from the nonmark and mark areas both exhibit the vague ring patterns, indicating that the Bi-Fe-͑N͒ layer remains amorphous prior and posterior to laser writing.…”
mentioning
confidence: 99%
“…Figure 3 presents the micrograph of signal marks in a recorded disk sample taken by transmission electron microscopy ͑TEM͒ ͑Jeol FX-II 2010͒. 18 Distinct, seashell-like signal marks with various recording lengths can be seen. Selected area electron diffraction ͑SAED͒ patterns taken from the nonmark and mark areas both exhibit the vague ring patterns, indicating that the Bi-Fe-͑N͒ layer remains amorphous prior and posterior to laser writing.…”
mentioning
confidence: 99%
“…The ZnS-SiO 2 (20 nm)/CdSe-SiO 2 SDG (60 nm)/ZnS-SiO 2 (20 nm) trilayer sample was prepared to observe the microstructural change of the CdSe-SiO 2 SDG mask layer written at the appropriate P w and read at 4 mW by transmission electron microscopy (TEM; Philips Tecnai 20). The method reported by Chen et al 16) was adopted in preparing the plan-view TEM (PTEM) specimens.…”
Section: Methodsmentioning
confidence: 99%
“…The method report by Nokukuni et al 8 and Chen et al 9 was adopted to prepare the plan-view TEM ͑PTEM͒ specimens. After removing the PC substrate, the disk sample was cut into small pieces using a pair of scissors.…”
Section: Methodsmentioning
confidence: 99%