2014
DOI: 10.7567/apex.7.025203
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InGaN quantum dot green light-emitting diodes with negligible blue shift of electroluminescence peak wavelength

Abstract: InGaN quantum dot (QD) light-emitting diodes (LEDs) were grown by metalorganic vapor phase epitaxy using an interruption method. As the injection current density increased from 2 to 88 A/cm2, the peak electroluminescence (EL) wavelength of the LED remained almost constant at around 527 nm. The negligible blue shift indicates that the quantum-confined Stark effect induced by piezoelectric polarization is suppressed well in InGaN QDs because of strain relaxation. Temperature-dependent EL spectra measurements ind… Show more

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Cited by 30 publications
(19 citation statements)
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“…In order to circumvent this problem inherent in InGaN QW active layers, an alternative InGaN quantum dot (QD) structure has been suggested as light-emitters in the green or longer spectral ranges. It has been shown both theoretically [ 8 , 9 ] and experimentally [ 10 , 11 ] that the piezoelectric polarization field and resulting quantum-confined Stark effect (QCSE) in InGaN QDs are much smaller than in QWs. Moreover, InGaN QDs inherently contain a lower density of structural defects due to the build-in strain field, leading to a reduced efficiency droop and a higher brightness [ 11 , 12 ].…”
Section: Introductionmentioning
confidence: 99%
“…In order to circumvent this problem inherent in InGaN QW active layers, an alternative InGaN quantum dot (QD) structure has been suggested as light-emitters in the green or longer spectral ranges. It has been shown both theoretically [ 8 , 9 ] and experimentally [ 10 , 11 ] that the piezoelectric polarization field and resulting quantum-confined Stark effect (QCSE) in InGaN QDs are much smaller than in QWs. Moreover, InGaN QDs inherently contain a lower density of structural defects due to the build-in strain field, leading to a reduced efficiency droop and a higher brightness [ 11 , 12 ].…”
Section: Introductionmentioning
confidence: 99%
“…Photoluminescence (PL) technique, a nondestructive and powerful method , has been widely used for the investigation of optical and electrical characters of semiconductors, such as carriers lifetime 1 2 , luminescence of impurities 3 4 and band structures 5 6 7 . Moreover, the PL technique is also an effective method for investigating the novel characters of low-dimensional structure, such as quantum wells 8 9 10 , quantum wires 11 12 13 and quantum dots 14 15 and an useful tool for exploring new materials for optical and electrical devices 16 17 . Because of the importance of the PL technique, it is crucial to get a deeper understanding of the PL process, especially the transport of photogenerated carriers in the PL process.…”
mentioning
confidence: 99%
“…Atomic force microscopy investigations on uncapped a -plane InGaN QD structures reveal QD heights of the order of 7±3 nm 45 . For capped polar InGaN/GaN QDs, lens-shaped structures with heights of 3–4 nm and diameters between 25–40 nm have been reported in the literature 59 . This information presents the starting point for our calculations in terms of dot size and shape.…”
Section: Methodsmentioning
confidence: 99%