1989
DOI: 10.1002/pssa.2211110233
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Infrared Reflectance of the GaAlAs/GaAs System

Abstract: The simple additive form of the dielectric function is used to describe the IR reflectance of the GaAlAs/GaAs system. A detailed numerical study shows a different degree of importance of the parameters involved. A reasonable correspondence is found between the experimental and model spectra; the discrepancies are, most probably due to the aluminium concentration gradient in the GaAlAs layer. The values of some important parameters (aluminium content and the plasma frequency) may be determined directly from the… Show more

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Cited by 4 publications
(6 citation statements)
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“…x As (x=0-0.54) in the frequency range 240-700 cm ' 1 at close to normal incidence (i.e., within approximately a 10° angle of incidence). The crystals were undoped and had free-electron concentrations in low 5xl0 16 cm" 3 . The reflectivity data were analyzed by using the KK dispersion relations and by curve fitting to the two forms for the classical dielectric function, one the additive form of Eq.…”
Section: Algaas Alloymentioning
confidence: 99%
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“…x As (x=0-0.54) in the frequency range 240-700 cm ' 1 at close to normal incidence (i.e., within approximately a 10° angle of incidence). The crystals were undoped and had free-electron concentrations in low 5xl0 16 cm" 3 . The reflectivity data were analyzed by using the KK dispersion relations and by curve fitting to the two forms for the classical dielectric function, one the additive form of Eq.…”
Section: Algaas Alloymentioning
confidence: 99%
“…x As layers have been studied by Lukes et al 16 using the two-grating and Fourier-transform spectroscopies. The AlAs content x in the layers varied from 0.05 to 0.77 and their thicknesses were in the range 4 to 38 urn.…”
Section: Algaas Alloymentioning
confidence: 99%
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