Infrared optical responses of wurtzite InxGa1−xN thin films with porous surface morphology

Yew, P.; Lee, S.C.; Ng, Sha Shiong; Hassan, H. Abu; Chen, W.L.; Osipowicz, T.; Ren, Min

doi:10.1016/j.tsf.2016.02.039

Thin Solid Films

2016

DOI: 10.1016/j.tsf.2016.02.039

|View full text |Cite

Infrared optical responses of wurtzite InxGa1−xN thin films with porous surface morphology

P. Yew

S.C. Lee

Sha Shiong Ng

et al.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2017

Publication Types

Select...

Article1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

(1 citation statement)

References 66 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…As an important part of the optical system, infrared optical film directly determines the image quality of the system [1][2][3][4] . Under cryogenic conditions in a space environment, its spectrum will drift significantly compared with the normal temperature, which is mainly caused by the temperature coefficient of the refractive index for an optical thin film [5][6][7] .…”

mentioning

confidence: 99%

Temperature coefficient of the refractive index for PbTe film

Zhou

et al. 2017

Chin. Opt. Lett.

View full text Add to dashboard Cite

Specimens of PbTe single film are deposited on Ge substrates by vacuum thermal evaporation. During the temperature range of 80-300 K, the transmittance of a PbTe film within 2-15 μm is measured every 20 K by the PerkinElmer Fourier transform infrared spectroscopy cryogenic testing system. Then, the relationship between the refractive index and wavelength within 7-12 μm at different temperatures is received by the full spectrum inversion method fitting. It can be seen that the relationship conforms to the Cauchy formula, which can be fitted. Then, the relationship between the refractive index of the PbTe film and the temperature/wavelength can be expressed as nðλ; T Þ ¼ 5.82840 − 0.00304T þ 4.61458 × 10 −6 T 2 þ 8.00280∕λ 2 þ 0.21544∕λ 4 , which is obtained by the fitting method based on the Cauchy formula. Finally, the designed value obtained by the formula and the measured spectrum are compared to verify the accuracy of the formula.

show abstract

mentioning

confidence: 99%

Temperature coefficient of the refractive index for PbTe film

Zhou

et al. 2017

Chin. Opt. Lett.

View full text Add to dashboard Cite

show abstract

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

hi@scite.ai

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Infrared optical responses of wurtzite InxGa1−xN thin films with porous surface morphology

Cited by 1 publication

References 66 publications

Temperature coefficient of the refractive index for PbTe film

Temperature coefficient of the refractive index for PbTe film

Contact Info

Product

Resources

About