2022
DOI: 10.1515/nanoph-2022-0283
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Infrared nanoplasmonic properties of hyperdoped embedded Si nanocrystals in the few electrons regime

Abstract: Using localized surface plasmon resonance (LSPR) as an optical probe we demonstrate the presence of free carriers in phosphorus doped silicon nanocrystals (SiNCs) embedded in a silica matrix. In small SiNCs, with radius ranging from 2.6 to 5.5  nm, the infrared spectroscopy study coupled to numerical simulations allows us to determine the number of electrically active phosphorus atoms with a precision of a few atoms. We demonstrate that LSP resonances can be supported with only about 10 free electrons per nano… Show more

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Cited by 6 publications
(14 citation statements)
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“…In the latter work, this value is underestimated by the presence of inactive P atoms in the oxide shell, which gives rise to an activation efficiency of 34% after chemical etching of the oxide shell. The value reported here is further in good agreement with activation efficiency values between 3 and 5% determined for heavily P-doped Si-NCs embedded in SiO 2 . Moreover, the spectral width of the LSPR peak is rather narrow as compared to the values reported in the literature. , One reason is probably the narrow P concentration distribution of doped Si-NCs, as indicated in Figure c.…”
Section: Resultssupporting
confidence: 91%
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“…In the latter work, this value is underestimated by the presence of inactive P atoms in the oxide shell, which gives rise to an activation efficiency of 34% after chemical etching of the oxide shell. The value reported here is further in good agreement with activation efficiency values between 3 and 5% determined for heavily P-doped Si-NCs embedded in SiO 2 . Moreover, the spectral width of the LSPR peak is rather narrow as compared to the values reported in the literature. , One reason is probably the narrow P concentration distribution of doped Si-NCs, as indicated in Figure c.…”
Section: Resultssupporting
confidence: 91%
“…The value reported here is further in good agreement with activation efficiency values between 3 and 5% determined for heavily P-doped Si-NCs embedded in SiO 2 . 28 Moreover, the spectral width of the LSPR peak is rather narrow as compared to the values reported in the literature. 23,38 One reason is probably the narrow P concentration distribution of doped Si-NCs, as indicated in Figure 3c.…”
Section: Resultsmentioning
confidence: 79%
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