Infrared ellipsometry—measurement of the optical properties of thin silver and gold films at 1.15, 3.39 and 10 μm

Adams, J. R.; Zeidler, J.R.; Bashara, N. M.

doi:10.1016/0030-4018(75)90197-2

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Ray Tracing a Reflective Surface Ellipsometry1

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2010

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Cited by 9 publications

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“…The complex-valued index of refraction for Ag films in the infrared is discussed in the literature [1,5,15,22,31,32,[39][40][41], summarized in Fig. 3.…”

Section: Ray Tracing a Reflective Surface Ellipsometrymentioning

confidence: 99%

Calculated Ellipsometry of the VLTI AT mirror train

Mathar¹

2010

Preprint

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The polarization effect of the 31 reflections within the mirror train of an auxiliary telescope of the Very Large Telescope Interferometer is calculated as a function of pointing direction and rotator angle. With a rough estimate of the mean complex index of refraction of the reflecting surfaces, their Jones matrices are concatenated while tracing a ray from M1 up to the feeding mirror in front of an instrument. The net effect is summarized in terms of the axis ratio of the polarization ellipse of star light that was circularly polarized above the primary mirror.

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“…The complex-valued index of refraction for Ag films in the infrared is discussed in the literature [1,5,15,22,31,32,[39][40][41], summarized in Fig. 3.…”

Section: Ray Tracing a Reflective Surface Ellipsometrymentioning

confidence: 99%