2004
DOI: 10.1016/j.tsf.2003.11.194
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Infrared ellipsometry characterization of conducting thin organic films

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Cited by 25 publications
(24 citation statements)
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“…It is worth noting that by the order of magnitude the values of e 0 ,[ 3 6 _ T D $ D I F F ] e 00 and n, k parameters determined for the PEDOT/PSS inclusions (see Fig. 5) are in reasonable agreement with similar parameters previously established for the PEDOT/PSS polymer by ellipsometry measurements in the 10-20 THz spectral range [34].…”
Section: Resultssupporting
confidence: 84%
“…It is worth noting that by the order of magnitude the values of e 0 ,[ 3 6 _ T D $ D I F F ] e 00 and n, k parameters determined for the PEDOT/PSS inclusions (see Fig. 5) are in reasonable agreement with similar parameters previously established for the PEDOT/PSS polymer by ellipsometry measurements in the 10-20 THz spectral range [34].…”
Section: Resultssupporting
confidence: 84%
“…of a protein layer at a solid/liquid interface, also to get the detailed information on the kinetics of layer formation, and monitor the adsorption processes of biomolecules in aqueous solution on a monolayer scale. With respect to organic materials, polymer thin films [77][78][79][80][81], self-assembled layers [82,83], Langmuir-Blodgett (LB) films [84,84], and liquid crystals [86,87] have been studied intensively using spectroscopic ellipsometry. Here, we will briefly overview biomaterial characterization using the ellipsometry technique, as shown in Fig.…”
Section: Application Of Ellipsometry In Stoichiometry 41 Surface Andmentioning
confidence: 99%
“…For the silicon sample a 2 nm thick native oxide was included in the analysis. For the epoxy sample and the sample with cobolt-ferrite nanoparticles in epoxy, model fits were performed with Lorentzian oscillators as described elsewhere [6].…”
Section: Spectroscopic Ellipsometrymentioning
confidence: 99%