Influences of phase transition and microstructure on dielectric properties of Bi0.5Na0.5Zr1-xTixO3 ceramics

Jaiban, Panupong; Rachakom, Ampika; Jiansirisomboon, Sukanda; Watcharapasorn, Anucha

doi:10.1186/1556-276x-7-45

Cited by 12 publications

(11 citation statements)

References 14 publications

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“…1) and an inset back-scattered electron image taken from our previous report (Fig. 2(f)) [6,7] could support further the compositional fluctuation in these samples. In addition, the diffuse phase transition due to the compositional inhomogeneity was observed similarly in other reports investigating Bi-and Na-based compounds [9,10].…”

Section: Downloaded By [Mcgill University Library] At 23:29 07 Februasupporting

confidence: 81%

“…054873) for Ti addition of x = 0.1 and 0.2, and ZrO 2 (JADE No.371484) for the Ti addition up to x = 0.3, which was attributed to the disintegration of the easily-melting composition i.e. Bi 2 O 3 and Na 2 CO 3 [6,7]. This evidence implied a compositional fluctuation of the system.…”

Section: Resultsmentioning

confidence: 94%

“…The quantitative data of lattice parameters for BNZT having x = 0, 0.1, 0.2, 0.5 and 0.6 The data are taken from previous report [2]. b The data are taken from previous report [6].…”

Section: Resultsmentioning

confidence: 99%

“…According to electrical property dependence of Zr/Ti composition for BZT, it then became our motivation to seek further understanding on electrical properties of Bi 0.5 Na 0.5 Zr 1-x Ti x O 3 (BNZT) ceramics. Accordingly, BNZT compositions where x = 0, 0.1, 0.2, 0.3, 0.4, 0.5 and 0.6 were investigated in our previous work and it was found that Ti addition apparently resulted in a phase transformation from a typical orthorhombic phase of BNZ to a rhombohedral phase in Ti-rich BNZT ceramic to cause an increase of dielectric properties at room temperature for both low and high applied field [6,7]. In order to bring better understanding on dielectric behavior and rhombohedral phase transition dominance in BNZT ceramics, the dielectric measurement BNZ and BNZT with Ti concentration of 0 ≤ x ≤ 0.6 as a function of the temperature was carried out and discussed in this study.…”

Section: Introductionmentioning

confidence: 99%

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Diffuse Dielectric Behavior of (Bi_0.5Na_0.5)Zr_1-xTi_xO₃Lead-Free Ceramics

et al. 2014

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Bi 0.5 Na 0.5 )Zr 1-x Ti x O 3 with x = 0, 0.1, 0.2, 0.3, 0.4, 0.5 and 0.6 ceramics were fabricated by a conventional sintering technique at 850-950 • C for 2 h. From X-ray diffraction study, three regions of different phases were observed in the ceramic system i.e., orthorhombic phase region (0 ≤ x ≤ 0.2), mixed-phase region (0.3 ≤ x ≤ 0.4), and rhombohedral phase region (0.5 ≤ x ≤ 0.6). The observed diffuse dielectric phase transition could be correlated to the compositional inhomogeneity of the samples. The dielectric properties as a function of the temperature at different frequency indicated normal ferroelectric behavior in BNZ and BNZT ceramics. The phase transformation from orthorhombic phase to rhombohderal phase affected significantly the dielectric enhancement and decrease of the maximum temperature in this ceramic system.

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Section: Downloaded By [Mcgill University Library] At 23:29 07 Februasupporting

confidence: 81%

Section: Resultsmentioning

confidence: 94%

“…The quantitative data of lattice parameters for BNZT having x = 0, 0.1, 0.2, 0.5 and 0.6 The data are taken from previous report [2]. b The data are taken from previous report [6].…”

Section: Resultsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Diffuse Dielectric Behavior of (Bi_0.5Na_0.5)Zr_1-xTi_xO₃Lead-Free Ceramics

et al. 2014

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“…. This is based on this study and literature data . The diagram shows a dominating cubic/pseudo cubic region suggesting that significant substitution in the BKT–BNZ system is not beneficial.…”

Section: Discussionsupporting

confidence: 63%

Solid‐State Synthesis and Properties of Relaxor (1−x)BKT–xBNZ Ceramics

et al. 2014

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Conventional solid‐state synthesis was used to synthesize dense and phase pure ceramics in the (1−x) Bi0.5K0.5TiO3–xBi0.5Na0.5ZrO3 (BKT–BNZ) system. Structural characterization was done using X‐ray diffraction at both room temperature and elevated temperatures, identifying a transition from tetragonal xBi0.5Na0.5ZrO3 (xBNZ, x = 0–0.10) to pseudo cubic xBNZ for x = 0.15–0.80. Dielectric properties were investigated with respect to both temperature (RT = 600°C) and frequency (1–106 Hz). Relaxor‐like behavior was retained for all the materials investigated, evident by the broadening of the relative dielectric permittivity peaks at transition temperatures as well as frequency dispersion at their maximum. The maximum dielectric constant at elevated temperature was found for 0.15 BNZ. Electric field‐induced strain and polarization response were also investigated for several compositions at RT and the largest field‐induced strain was observed for the 0.10 BNZ ceramics. The composition range with best performance coincides with the transition from tetragonal to cubic crystal structure.

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