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2019
DOI: 10.1016/j.actamat.2018.12.016
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Influence of topological constraints on ion damage resistance of amorphous hydrogenated silicon carbide

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Cited by 5 publications
(5 citation statements)
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“…nuclear energy (fission & fusion), electronic devices in space vehicles, particle detectors, semiconductor doping etc. 1 7 , wherein materials are subjected to severe irradiation with low energy and/or high energy particles (predominantly slowing down by ballistic/nuclear collisions (S n ) 8 and electronic excitations (S e ) 8 respectively) during service. For these applications, understanding the behaviour of the materials under irradiation, and thus designing them to be more radiation damage tolerant, is therefore crucial.…”
Section: Introductionmentioning
confidence: 99%
“…nuclear energy (fission & fusion), electronic devices in space vehicles, particle detectors, semiconductor doping etc. 1 7 , wherein materials are subjected to severe irradiation with low energy and/or high energy particles (predominantly slowing down by ballistic/nuclear collisions (S n ) 8 and electronic excitations (S e ) 8 respectively) during service. For these applications, understanding the behaviour of the materials under irradiation, and thus designing them to be more radiation damage tolerant, is therefore crucial.…”
Section: Introductionmentioning
confidence: 99%
“…Further applications are reactions occurring during the deposition of low-κ dielectric SiCO/H materials, as well as thermal treatment of these materials (post or concurrent synthesis) in reactive atmospheres such as H 2 O, CO 2 , or H 2 . Future direction involves thermodynamic and kinetic stability of dielectric films, thermal conductivity, and the effects of radiation damage , or ion implantation . Obviously, force field development is an ongoing process with room for improvement and progress.…”
Section: Discussionmentioning
confidence: 99%
“…The network connectivity thus determines Young's modulus in proportion to a power law with exponent 1.5 . This may allow the prediction of physical sputtering yields and RIE rates …”
Section: Challengesmentioning
confidence: 99%