“…In addition, during film growth on alumina, substrate defects significantly increase the rate of nucleation, reducing the height of the activation barrier, which leads to rapid filling of the substrate with islands of low height [44]. This mechanism of growth of FE films occurs, as a rule, on polycrystalline substrates that are not structure-forming for the growing film, which subsequently leads to the formation of a polycrystalline layer [41,45]. The MEIS analysis data show that the thickness of the SBN island films deposited at temperatures 750-950 °C ranges from 1.3 to 2.16 nm, the degree of substrate area covered by islands ranges from 23% to 42%, and both parameters do not correlate with the change in substrate temperature.…”