2021
DOI: 10.1021/acsomega.0c04837
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Influence of the Substrate, Process Conditions, and Postannealing Temperature on the Properties of ZnO Thin Films Grown by the Successive Ionic Layer Adsorption and Reaction Method

Abstract: Here, we report the effect of the substrate, sonication process, and postannealing on the structural, morphological, and optical properties of ZnO thin films grown in the presence of isopropyl alcohol (IPA) at temperature 30–65 °C by the successive ionic layer adsorption and reaction (SILAR) method on both soda lime glass (SLG) and Cu foil. The X-ray diffraction (XRD) patterns confirmed the preferential growth thin films along (002) and (101) planes of the wurtzite ZnO structure when deposited on SLG and Cu fo… Show more

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Cited by 56 publications
(31 citation statements)
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References 65 publications
(127 reference statements)
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“…There are a few studies 29 31 , where solvents such as ethylene, isopropyl alcohol, etc. were used in the process of obtaining ZnO by SILAR.…”
Section: Introductionmentioning
confidence: 99%
“…There are a few studies 29 31 , where solvents such as ethylene, isopropyl alcohol, etc. were used in the process of obtaining ZnO by SILAR.…”
Section: Introductionmentioning
confidence: 99%
“…In order to elucidate the mean crystallite domain size ( d) of the synthesized product, the Scherrer's equation (3.1) [ 43 ] was utilized. where K is Scherrer's constant, equal to 0.94, λ is the wavelength of X-ray radiation used ( λ = 1.5406 Å), θ is the Bragg diffraction angle and β is the full width at half maximum (FWHM) in radiation.…”
Section: Resultsmentioning
confidence: 99%
“…It can be seen that diffraction peaks for product-A are slightly shifted to higher 2 θ values compared with that of product-B (indicated by the major diffraction peaks of Ca(OH) 2 denoted by dashed line in figure 6), which is presumably due to the stress–strain effect owing to the combined presence of Ca(OH) 2 and CaCO 3 . The lattice strain, ε of crystal at the plane *(101) and #(104) were determined using the following expression (3.2) [43]:ε =true0β4tanθ.The calculated value of the lattice strain was found to be 2.92 × 10 −3 (product-A) and 3.36 × 10 −3 (product-B) considering the plane *(101) of Ca(OH) 2 and 2.60 × 10 −3 (product-A) and 4.40 × 10 −3 (product-B) while considering the plane #(104) of CaCO 3 . In both cases, microstrain in product-B is higher than that of product-A.…”
Section: Resultsmentioning
confidence: 99%
“…In order to elucidate the mean crystallite domain size (d ) of the synthesized product, the Scherrer's equation ( 1) [43] was utilized.…”
Section: Xrd Analyses Of Pms Source and Productsmentioning
confidence: 99%
“…CaCO3. The lattice strain, ε of crystal at the plane *(101) and #(104) were determined using the following expression (2) [43].…”
Section: Xrd Analyses Of Pms Source and Productsmentioning
confidence: 99%