Influence of structural and morphological properties on the “intrinsic” field emission of CVD diamond films

Gohl, A.; Habermann, T.; Müller, Günter; Nau, D.; Wedel, Michael; Christ, Monika; Schreck, M.; Stritzker, B.

doi:10.1016/s0925-9635(97)00285-9

Cited by 15 publications

(4 citation statements)

References 13 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…9. While the structural properties of the diamond films as deduced by Raman spectroscopy did not systematically affect the FE properties, a significant correlation between E on and the morphology was observed.…”

Section: Influence Of Fabrication Parametersmentioning

confidence: 77%

Modifying chemical vapor deposited diamond films for field emission displays

Habermann

Gohl

Nau

et al. 1998

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

Self Cite

View full text Add to dashboard Cite

Electron emission characteristics of boron nitride films synthesized by plasma-assisted chemical vapor deposition J.A systematic investigation of deposition parameters and post-treatments was performed for the development of field emission displays based on flat chemical vapor deposited diamond films. The lowest onset field strengths were obtained for films grown at the highest substrate temperature, highest methane content, and with negatively biased substrate. Intentionally damaging the films by implantation with 50 keV and 100 keV carbon ions as well as with 4.4 MeV silicon ions usually resulted in an enhanced field emission. The emission followed the Fowler-Nordheim law up to 0.5 mA/mm 2 , and a current carrying ability of more than 100 mA/mm 2 was detected. Considerably improved emission was achieved by short and long-term processing at higher current levels.

show abstract

Section: Influence Of Fabrication Parametersmentioning

confidence: 77%

Modifying chemical vapor deposited diamond films for field emission displays

Habermann

Gohl

Nau

et al. 1998

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

Self Cite

View full text Add to dashboard Cite

show abstract

“…Therefore, field emission ͑FE͒ properties of diamond, [1][2][3] amorphous carbon 4 films, carbon nanostructures, 5 and many related materials have been investigated. Therefore, field emission ͑FE͒ properties of diamond, [1][2][3] amorphous carbon 4 films, carbon nanostructures, 5 and many related materials have been investigated.…”

Section: Introductionmentioning

confidence: 99%

Integral and local field emission analyses of nanodiamond coatings for power applications

Gohl

Alimova

Habermann

et al. 1999

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

Self Cite

View full text Add to dashboard Cite

Nanodiamond ͑ND͒ powder coatings are very promising for cold cathode applications. The suitability of a ͑di͒electrophoretically deposited ND coating ͑crystallite size: 1-10 nm͒ for high current applications was analyzed depending on three types of Si substrates ͑flat, rough, Si tip array͒. Nondestructive direct current field emission ͑FE͒ investigations were performed by means of a field emission scanning microscope. FE properties like the electrical onset field strength E on ͑at 0.5 nA͒, current I vs E behavior, maximum current carrying ability as well as the local distribution and uniformity of emitters were analyzed by using anodes of different apex diameters D. A decrease of E on for Dϭ10/100/1000 m from 203/190/109 V/m of the flat to 67/44/20 V/m of the rough, and to Ϸ7/6.7/4.5 V/m of the tip array sample is achieved by the geometrical field enhancement of the structures. The reproducible high-current density J REP Ͼ15 A/cm 2 for Dϭ10 m of the flat and rough sample exhibits the large potential of the ND coating for power applications. Their nonuniformity due to the m-roughness results, however, in a low J REP for large areas. In contrast, ND coated tips showed a good uniformity over mm 2 size and a moderate J REP Ϸ0.2 A/cm 2 , basing on about 40% of significantly emitting tips.

show abstract

“…[1][2][3][4][5][6] However, despite the intense interest in field emission ͑FE͒ from CVD-grown diamond films and other carbon materials, 7,8 the mechanism of this phenomenon is still not clear. In particular, the emission is extremely spatially nonuniform, with some regions emitting and others not.…”

mentioning

confidence: 99%

“…[6][7][8] However, CITS ͓or current-voltage (I -V)͔ measurements are at best an indirect characterization of FE. Separation-voltage (S -V) spectroscopy can be used to provide a direct measure of FE, [1][2][3][4][5] where S is the tip displacement ͑not absolute tip-sample distance͒ required to maintain constant emission current for varying tip-sample voltage V. The reciprocal of the slope of the S -V plot provides so-called ''turn-on'' field for electron emission, i.e., the electric field necessary to induce the emission of the set current. The S -V method of FE measurement is superior to the CITS or I -V techniques commonly used [6][7][8] because ͑i͒ for S -V measurements the current density remains constant, whereas for I -V measurements the current density increases dramatically and the probability of modifying the surface during the measurement becomes high and ͑ii͒ the turn-on field can be determined from the slope of the S -V curve and does not depend on a knowledge of the ab-solute tip-sample distance which is not usually known to any accuracy.…”

mentioning

confidence: 99%